Apparatus for JTAG-driven remote scanning

A scan circuit (JTAG 1149 extension) for a microprocessor utilizes transport logic and scan chains which operate at a faster clock speed than the external JTAG clock. The transport logic converts the input serial data stream (TDI) into input data packets which are sent to scan chains, and converts o...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HORBACH HOLGER, GEUKES BENEDIKT, WALZ MANFRED, MICHEL MATTEO, DOERR MARTIN
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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