Semiconductor device and test system for testing the same
A semiconductor device includes a test pattern decoding unit and a scan chain unit. The test pattern receives a scan-in pattern from an external test device and generates a test pattern based on the scan-in pattern and a scan-out pattern. The scan-in pattern is decoded based on a seed pattern and an...
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Zusammenfassung: | A semiconductor device includes a test pattern decoding unit and a scan chain unit. The test pattern receives a scan-in pattern from an external test device and generates a test pattern based on the scan-in pattern and a scan-out pattern. The scan-in pattern is decoded based on a seed pattern and an expectation pattern. The scan chain unit performs logical operation based on the test pattern and feedbacks the scan-out pattern to the test pattern decoding unit. |
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