Method and apparatus for post-silicon testing
An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in...
Gespeichert in:
| Hauptverfasser: | , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | BIN EYAL TSANKO ELENA LANDA SHIMON KOYFMAN ANATOLY SOKHIN VITALI COPTY SHADY ADIR ALLON NAHIR AMIR |
| description | An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8892386B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8892386B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8892386B23</originalsourceid><addsrcrecordid>eNrjZND1TS3JyE9RSMwD4oKCxKLEktJihbT8IoWC_OIS3eLMnMzk_DyFktTiksy8dB4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEh8abGFhaWRsYeZkZEyEEgCDeCos</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and apparatus for post-silicon testing</title><source>esp@cenet</source><creator>BIN EYAL ; TSANKO ELENA ; LANDA SHIMON ; KOYFMAN ANATOLY ; SOKHIN VITALI ; COPTY SHADY ; ADIR ALLON ; NAHIR AMIR</creator><creatorcontrib>BIN EYAL ; TSANKO ELENA ; LANDA SHIMON ; KOYFMAN ANATOLY ; SOKHIN VITALI ; COPTY SHADY ; ADIR ALLON ; NAHIR AMIR</creatorcontrib><description>An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20141118&DB=EPODOC&CC=US&NR=8892386B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20141118&DB=EPODOC&CC=US&NR=8892386B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BIN EYAL</creatorcontrib><creatorcontrib>TSANKO ELENA</creatorcontrib><creatorcontrib>LANDA SHIMON</creatorcontrib><creatorcontrib>KOYFMAN ANATOLY</creatorcontrib><creatorcontrib>SOKHIN VITALI</creatorcontrib><creatorcontrib>COPTY SHADY</creatorcontrib><creatorcontrib>ADIR ALLON</creatorcontrib><creatorcontrib>NAHIR AMIR</creatorcontrib><title>Method and apparatus for post-silicon testing</title><description>An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND1TS3JyE9RSMwD4oKCxKLEktJihbT8IoWC_OIS3eLMnMzk_DyFktTiksy8dB4G1rTEnOJUXijNzaDg5hri7KGbWpAfn1pckJicmpdaEh8abGFhaWRsYeZkZEyEEgCDeCos</recordid><startdate>20141118</startdate><enddate>20141118</enddate><creator>BIN EYAL</creator><creator>TSANKO ELENA</creator><creator>LANDA SHIMON</creator><creator>KOYFMAN ANATOLY</creator><creator>SOKHIN VITALI</creator><creator>COPTY SHADY</creator><creator>ADIR ALLON</creator><creator>NAHIR AMIR</creator><scope>EVB</scope></search><sort><creationdate>20141118</creationdate><title>Method and apparatus for post-silicon testing</title><author>BIN EYAL ; TSANKO ELENA ; LANDA SHIMON ; KOYFMAN ANATOLY ; SOKHIN VITALI ; COPTY SHADY ; ADIR ALLON ; NAHIR AMIR</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8892386B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>BIN EYAL</creatorcontrib><creatorcontrib>TSANKO ELENA</creatorcontrib><creatorcontrib>LANDA SHIMON</creatorcontrib><creatorcontrib>KOYFMAN ANATOLY</creatorcontrib><creatorcontrib>SOKHIN VITALI</creatorcontrib><creatorcontrib>COPTY SHADY</creatorcontrib><creatorcontrib>ADIR ALLON</creatorcontrib><creatorcontrib>NAHIR AMIR</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BIN EYAL</au><au>TSANKO ELENA</au><au>LANDA SHIMON</au><au>KOYFMAN ANATOLY</au><au>SOKHIN VITALI</au><au>COPTY SHADY</au><au>ADIR ALLON</au><au>NAHIR AMIR</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for post-silicon testing</title><date>2014-11-18</date><risdate>2014</risdate><abstract>An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US8892386B2 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Method and apparatus for post-silicon testing |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T14%3A36%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BIN%20EYAL&rft.date=2014-11-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8892386B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |