Method and apparatus for post-silicon testing

Method and apparatus for post-silicon testing

An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: BIN EYAL, TSANKO ELENA, LANDA SHIMON, KOYFMAN ANATOLY, SOKHIN VITALI, COPTY SHADY, ADIR ALLON, NAHIR AMIR
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection.