Scan compression architecture with bypassable scan chains for low test mode power

Scan compression architecture with bypassable scan chains for low test mode power

This invention permits selectively bypasses serial scan chains. Constant or low toggle data is directed to the bypassed serial scan chain, thus reducing power consumption. The number and identity of serial scan chains bypassed during a particular test can be changed dynamically dependent upon the se...

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Hauptverfasser: PAREKHJI RUBIN AJIT, TIWARI RAJESH KUMAR, RAVI SRIVATHS
Format: Patent
Sprache:eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator PAREKHJI RUBIN AJIT
TIWARI RAJESH KUMAR
RAVI SRIVATHS
description This invention permits selectively bypasses serial scan chains. Constant or low toggle data is directed to the bypassed serial scan chain, thus reducing power consumption. The number and identity of serial scan chains bypassed during a particular test can be changed dynamically dependent upon the semiconductor process variations of a particular integrated circuit. This enables an optimal test to be preformed for integrated circuits having differing semiconductor process variations.
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MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Scan compression architecture with bypassable scan chains for low test mode power
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