Electron beam data storage system and method for high volume manufacturing

The present disclosure provides for many different embodiments of a charged particle beam data storage system and method. In an example, a method includes dividing a design layout into a plurality of units; creating a lookup table that maps each of the plurality of units to its position within the d...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LIN TZUIN, LIU RU-GUN, CHEN JENG-HORNG, CHEN PEI-SHIANG, WANG HUNGUN, KRECINIC FARUK, HUANG WENUN
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure provides for many different embodiments of a charged particle beam data storage system and method. In an example, a method includes dividing a design layout into a plurality of units; creating a lookup table that maps each of the plurality of units to its position within the design layout and a data set, wherein the lookup table associates any repeating units in the plurality of units to a same data set; and exposing an energy sensitive layer to a charged particle beam based on the lookup table.