Sampling device and method of use thereof
An sampling device for capturing a material sample and a method of using said device to process said material sample in situ within the device. Embodiments of the invention may be disposed as elongate probes having extendable sample capture elements. A sample capture element of such a device may inc...
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| creator | WARD, II HOWARD WILLIAM BLACKLIN PETER ALFRED HAWKINS JOEL MICHAEL FOWLER, JR. WAYNE |
| description | An sampling device for capturing a material sample and a method of using said device to process said material sample in situ within the device. Embodiments of the invention may be disposed as elongate probes having extendable sample capture elements. A sample capture element of such a device may include a sample capture pocket located near a distal end thereof for capturing and trapping a sample of material. The sample capture pocket may be provided with a port for receiving material therein and a port for expelling material therefrom. These ports may be placed in communication with corresponding material transfer channels extending through the sample capture element to allow for the in situ processing of a material sample, and the subsequent discharge of the sample to an analyzer or another downstream location. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8789431B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8789431B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8789431B23</originalsourceid><addsrcrecordid>eNrjZNAMTswtyMnMS1dISS3LTE5VSMxLUchNLcnIT1HIT1MoLU5VKMlILUrNT-NhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwRbmFpYmxoZORsZEKAEAjsEoIA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Sampling device and method of use thereof</title><source>esp@cenet</source><creator>WARD, II HOWARD WILLIAM ; BLACKLIN PETER ALFRED ; HAWKINS JOEL MICHAEL ; FOWLER, JR. WAYNE</creator><creatorcontrib>WARD, II HOWARD WILLIAM ; BLACKLIN PETER ALFRED ; HAWKINS JOEL MICHAEL ; FOWLER, JR. WAYNE</creatorcontrib><description>An sampling device for capturing a material sample and a method of using said device to process said material sample in situ within the device. Embodiments of the invention may be disposed as elongate probes having extendable sample capture elements. A sample capture element of such a device may include a sample capture pocket located near a distal end thereof for capturing and trapping a sample of material. The sample capture pocket may be provided with a port for receiving material therein and a port for expelling material therefrom. These ports may be placed in communication with corresponding material transfer channels extending through the sample capture element to allow for the in situ processing of a material sample, and the subsequent discharge of the sample to an analyzer or another downstream location.</description><language>eng</language><subject>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; PHYSICS ; TESTING ; TRANSPORTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140729&DB=EPODOC&CC=US&NR=8789431B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140729&DB=EPODOC&CC=US&NR=8789431B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WARD, II HOWARD WILLIAM</creatorcontrib><creatorcontrib>BLACKLIN PETER ALFRED</creatorcontrib><creatorcontrib>HAWKINS JOEL MICHAEL</creatorcontrib><creatorcontrib>FOWLER, JR. WAYNE</creatorcontrib><title>Sampling device and method of use thereof</title><description>An sampling device for capturing a material sample and a method of using said device to process said material sample in situ within the device. Embodiments of the invention may be disposed as elongate probes having extendable sample capture elements. A sample capture element of such a device may include a sample capture pocket located near a distal end thereof for capturing and trapping a sample of material. The sample capture pocket may be provided with a port for receiving material therein and a port for expelling material therefrom. These ports may be placed in communication with corresponding material transfer channels extending through the sample capture element to allow for the in situ processing of a material sample, and the subsequent discharge of the sample to an analyzer or another downstream location.</description><subject>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAMTswtyMnMS1dISS3LTE5VSMxLUchNLcnIT1HIT1MoLU5VKMlILUrNT-NhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwRbmFpYmxoZORsZEKAEAjsEoIA</recordid><startdate>20140729</startdate><enddate>20140729</enddate><creator>WARD, II HOWARD WILLIAM</creator><creator>BLACKLIN PETER ALFRED</creator><creator>HAWKINS JOEL MICHAEL</creator><creator>FOWLER, JR. WAYNE</creator><scope>EVB</scope></search><sort><creationdate>20140729</creationdate><title>Sampling device and method of use thereof</title><author>WARD, II HOWARD WILLIAM ; BLACKLIN PETER ALFRED ; HAWKINS JOEL MICHAEL ; FOWLER, JR. WAYNE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8789431B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WARD, II HOWARD WILLIAM</creatorcontrib><creatorcontrib>BLACKLIN PETER ALFRED</creatorcontrib><creatorcontrib>HAWKINS JOEL MICHAEL</creatorcontrib><creatorcontrib>FOWLER, JR. WAYNE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WARD, II HOWARD WILLIAM</au><au>BLACKLIN PETER ALFRED</au><au>HAWKINS JOEL MICHAEL</au><au>FOWLER, JR. WAYNE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sampling device and method of use thereof</title><date>2014-07-29</date><risdate>2014</risdate><abstract>An sampling device for capturing a material sample and a method of using said device to process said material sample in situ within the device. Embodiments of the invention may be disposed as elongate probes having extendable sample capture elements. A sample capture element of such a device may include a sample capture pocket located near a distal end thereof for capturing and trapping a sample of material. The sample capture pocket may be provided with a port for receiving material therein and a port for expelling material therefrom. These ports may be placed in communication with corresponding material transfer channels extending through the sample capture element to allow for the in situ processing of a material sample, and the subsequent discharge of the sample to an analyzer or another downstream location.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS TESTING TRANSPORTING |
| title | Sampling device and method of use thereof |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T14%3A35%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WARD,%20II%20HOWARD%20WILLIAM&rft.date=2014-07-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8789431B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |