Imaging method and system
An example imaging system including a detector, a transconductance amplifier, a charge integrator, and a current mirror is disclosed. The detector is coupled to a first current and configured to accumulate charges in response to light or radiation. The transconductance amplifier is configured to rec...
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creator | ROOS PIETER GERHARD |
description | An example imaging system including a detector, a transconductance amplifier, a charge integrator, and a current mirror is disclosed. The detector is coupled to a first current and configured to accumulate charges in response to light or radiation. The transconductance amplifier is configured to receive a pixel voltage of the detector and generate a second current according to the pixel voltage, wherein the pixel voltage is associated with the accumulated charges and the first current. The charge integrator is configured to generate an output signal according to a third current. The current mirror is configured to generate the first current and the third current according to the second current so that the first current gradually decreases as the pixel voltage approaches a reference voltage. |
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The transconductance amplifier is configured to receive a pixel voltage of the detector and generate a second current according to the pixel voltage, wherein the pixel voltage is associated with the accumulated charges and the first current. The charge integrator is configured to generate an output signal according to a third current. The current mirror is configured to generate the first current and the third current according to the second current so that the first current gradually decreases as the pixel voltage approaches a reference voltage.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140722&DB=EPODOC&CC=US&NR=8785872B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140722&DB=EPODOC&CC=US&NR=8785872B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ROOS PIETER GERHARD</creatorcontrib><title>Imaging method and system</title><description>An example imaging system including a detector, a transconductance amplifier, a charge integrator, and a current mirror is disclosed. The detector is coupled to a first current and configured to accumulate charges in response to light or radiation. The transconductance amplifier is configured to receive a pixel voltage of the detector and generate a second current according to the pixel voltage, wherein the pixel voltage is associated with the accumulated charges and the first current. The charge integrator is configured to generate an output signal according to a third current. The current mirror is configured to generate the first current and the third current according to the second current so that the first current gradually decreases as the pixel voltage approaches a reference voltage.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD0zE1Mz8xLV8hNLcnIT1FIzEtRKK4sLknN5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBFuYWphbmRk6GxkQoAQDTSCJf</recordid><startdate>20140722</startdate><enddate>20140722</enddate><creator>ROOS PIETER GERHARD</creator><scope>EVB</scope></search><sort><creationdate>20140722</creationdate><title>Imaging method and system</title><author>ROOS PIETER GERHARD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8785872B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>ROOS PIETER GERHARD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ROOS PIETER GERHARD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Imaging method and system</title><date>2014-07-22</date><risdate>2014</risdate><abstract>An example imaging system including a detector, a transconductance amplifier, a charge integrator, and a current mirror is disclosed. The detector is coupled to a first current and configured to accumulate charges in response to light or radiation. The transconductance amplifier is configured to receive a pixel voltage of the detector and generate a second current according to the pixel voltage, wherein the pixel voltage is associated with the accumulated charges and the first current. The charge integrator is configured to generate an output signal according to a third current. The current mirror is configured to generate the first current and the third current according to the second current so that the first current gradually decreases as the pixel voltage approaches a reference voltage.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Imaging method and system |
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