Measurement system and imager comprising such a system
A measurement system including a reference resistive sensor traversed by a reference current, with a reference arm having a reference resistance and being traversed by the reference current in order to produce a reference voltage between its ends, at least one measurement resistive sensor traversed...
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| creator | TCHAGASPANIAN MICHAEL DUPONT BERTRAND |
| description | A measurement system including a reference resistive sensor traversed by a reference current, with a reference arm having a reference resistance and being traversed by the reference current in order to produce a reference voltage between its ends, at least one measurement resistive sensor traversed by a measurement current that depends on a measurement taken by the measurement resistive sensor, a measurement mirror arm traversed by a current, and a device for measuring the difference between the measurement current and the current traversing the measurement mirror arm. The resistance of the measurement mirror arm of each measurement resistive sensor is equal to the reference resistance and the measurement system further includes a device for applying, to each measurement mirror arm, the reference voltage. The device for applying the reference voltage being designed to the isolated to a current of the measurement mirror arm when the reference voltage is applied. |
| format | Patent |
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The resistance of the measurement mirror arm of each measurement resistive sensor is equal to the reference resistance and the measurement system further includes a device for applying, to each measurement mirror arm, the reference voltage. The device for applying the reference voltage being designed to the isolated to a current of the measurement mirror arm when the reference voltage is applied.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FREQUENCY-CHANGING ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; SEMICONDUCTOR DEVICES ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140722&DB=EPODOC&CC=US&NR=8785854B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140722&DB=EPODOC&CC=US&NR=8785854B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TCHAGASPANIAN MICHAEL</creatorcontrib><creatorcontrib>DUPONT BERTRAND</creatorcontrib><title>Measurement system and imager comprising such a system</title><description>A measurement system including a reference resistive sensor traversed by a reference current, with a reference arm having a reference resistance and being traversed by the reference current in order to produce a reference voltage between its ends, at least one measurement resistive sensor traversed by a measurement current that depends on a measurement taken by the measurement resistive sensor, a measurement mirror arm traversed by a current, and a device for measuring the difference between the measurement current and the current traversing the measurement mirror arm. The resistance of the measurement mirror arm of each measurement resistive sensor is equal to the reference resistance and the measurement system further includes a device for applying, to each measurement mirror arm, the reference voltage. The device for applying the reference voltage being designed to the isolated to a current of the measurement mirror arm when the reference voltage is applied.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FREQUENCY-CHANGING</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>NON-LINEAR OPTICS</subject><subject>OPTICAL ANALOGUE/DIGITAL CONVERTERS</subject><subject>OPTICAL LOGIC ELEMENTS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDzTU0sLi1KzU3NK1EoriwuSc1VSMxLUcjMTUxPLVJIzs8tKMoszsxLVyguTc5QSISq4WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBFuYWphamJk5GxkQoAQBtLC2w</recordid><startdate>20140722</startdate><enddate>20140722</enddate><creator>TCHAGASPANIAN MICHAEL</creator><creator>DUPONT BERTRAND</creator><scope>EVB</scope></search><sort><creationdate>20140722</creationdate><title>Measurement system and imager comprising such a system</title><author>TCHAGASPANIAN MICHAEL ; DUPONT BERTRAND</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8785854B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FREQUENCY-CHANGING</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>NON-LINEAR OPTICS</topic><topic>OPTICAL ANALOGUE/DIGITAL CONVERTERS</topic><topic>OPTICAL LOGIC ELEMENTS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TCHAGASPANIAN MICHAEL</creatorcontrib><creatorcontrib>DUPONT BERTRAND</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TCHAGASPANIAN MICHAEL</au><au>DUPONT BERTRAND</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Measurement system and imager comprising such a system</title><date>2014-07-22</date><risdate>2014</risdate><abstract>A measurement system including a reference resistive sensor traversed by a reference current, with a reference arm having a reference resistance and being traversed by the reference current in order to produce a reference voltage between its ends, at least one measurement resistive sensor traversed by a measurement current that depends on a measurement taken by the measurement resistive sensor, a measurement mirror arm traversed by a current, and a device for measuring the difference between the measurement current and the current traversing the measurement mirror arm. The resistance of the measurement mirror arm of each measurement resistive sensor is equal to the reference resistance and the measurement system further includes a device for applying, to each measurement mirror arm, the reference voltage. The device for applying the reference voltage being designed to the isolated to a current of the measurement mirror arm when the reference voltage is applied.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FREQUENCY-CHANGING MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING |
| title | Measurement system and imager comprising such a system |
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