System and method for eliminating the effect of non-primary laser modes on characterization of optical components through characterized decomposition

A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the...

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Bibliographische Detailangaben

Hauptverfasser:	MINNEMAN MICHAEL, CRAWFORD MICHAEL
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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