Device and method for quantifying a surface's cleanliness

Provided are devices and methods for quantifying a surface's cleanliness relative to a contaminant. Such devices and methods may comprise and/or use a source of interrogating radiation to which the contaminant is responsive, a means for directing the interrogating radiation, a detector, and an...

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Bibliographische Detailangaben
1. Verfasser:	LAWLESS JOHN L
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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