Micro electro mechanical switch system and method for testing and configuring semiconductor functional circuits

The present invention systems and methods enable configuration of functional components in integrated circuits. A present invention system and method utilizes micro electro-mechanical switches included in pathways of an integrated circuit to flexibly change the operational characteristics of functio...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	DIAMOND MICHAEL B
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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