Micro electro mechanical switch system and method for testing and configuring semiconductor functional circuits
The present invention systems and methods enable configuration of functional components in integrated circuits. A present invention system and method utilizes micro electro-mechanical switches included in pathways of an integrated circuit to flexibly change the operational characteristics of functio...
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| creator | DIAMOND MICHAEL B |
| description | The present invention systems and methods enable configuration of functional components in integrated circuits. A present invention system and method utilizes micro electro-mechanical switches included in pathways of an integrated circuit to flexibly change the operational characteristics of functional components in an integrated circuit die based upon a variety of factors including power conservation, manufacturing defects, compatibility characteristics, performance requirements, and system health (e.g., the number of components operating properly). The micro electro-mechanical switches are selectively opened and closed to permit and prevent electrical current flow to and from functional components. Opening the micro electro-mechanical switches also enables power conservation by facilitating isolation of a component and minimization of impacts associated with leakage currents. |
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| subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | Micro electro mechanical switch system and method for testing and configuring semiconductor functional circuits |
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