Luminescence reference standards
The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before,...
Gespeichert in:
| Hauptverfasser: | , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | BODNER KEVIN S LAU ALDRICH N. K PHILLIPS J. MICHAEL TRACY DAVID H OLDHAM MARK F BOEGE STEVEN J SANDELL DONALD R |
| description | The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8659755B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8659755B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8659755B23</originalsourceid><addsrcrecordid>eNrjZFDwKc3NzEstTk7NS05VKEpNSy0Cs4pLEvNSEotSinkYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQSJQZ2pJfGiwhZmppbmpqZORMRFKADfeJYE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Luminescence reference standards</title><source>esp@cenet</source><creator>BODNER KEVIN S ; LAU ALDRICH N. K ; PHILLIPS J. MICHAEL ; TRACY DAVID H ; OLDHAM MARK F ; BOEGE STEVEN J ; SANDELL DONALD R</creator><creatorcontrib>BODNER KEVIN S ; LAU ALDRICH N. K ; PHILLIPS J. MICHAEL ; TRACY DAVID H ; OLDHAM MARK F ; BOEGE STEVEN J ; SANDELL DONALD R</creatorcontrib><description>The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.</description><language>eng</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES ; MEASURING ; NANOTECHNOLOGY ; PERFORMING OPERATIONS ; PHYSICS ; RADIATION PYROMETRY ; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES ; TESTING ; TRANSPORTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140225&DB=EPODOC&CC=US&NR=8659755B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140225&DB=EPODOC&CC=US&NR=8659755B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BODNER KEVIN S</creatorcontrib><creatorcontrib>LAU ALDRICH N. K</creatorcontrib><creatorcontrib>PHILLIPS J. MICHAEL</creatorcontrib><creatorcontrib>TRACY DAVID H</creatorcontrib><creatorcontrib>OLDHAM MARK F</creatorcontrib><creatorcontrib>BOEGE STEVEN J</creatorcontrib><creatorcontrib>SANDELL DONALD R</creatorcontrib><title>Luminescence reference standards</title><description>The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</subject><subject>MEASURING</subject><subject>NANOTECHNOLOGY</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDwKc3NzEstTk7NS05VKEpNSy0Cs4pLEvNSEotSinkYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQSJQZ2pJfGiwhZmppbmpqZORMRFKADfeJYE</recordid><startdate>20140225</startdate><enddate>20140225</enddate><creator>BODNER KEVIN S</creator><creator>LAU ALDRICH N. K</creator><creator>PHILLIPS J. MICHAEL</creator><creator>TRACY DAVID H</creator><creator>OLDHAM MARK F</creator><creator>BOEGE STEVEN J</creator><creator>SANDELL DONALD R</creator><scope>EVB</scope></search><sort><creationdate>20140225</creationdate><title>Luminescence reference standards</title><author>BODNER KEVIN S ; LAU ALDRICH N. K ; PHILLIPS J. MICHAEL ; TRACY DAVID H ; OLDHAM MARK F ; BOEGE STEVEN J ; SANDELL DONALD R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8659755B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</topic><topic>MEASURING</topic><topic>NANOTECHNOLOGY</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BODNER KEVIN S</creatorcontrib><creatorcontrib>LAU ALDRICH N. K</creatorcontrib><creatorcontrib>PHILLIPS J. MICHAEL</creatorcontrib><creatorcontrib>TRACY DAVID H</creatorcontrib><creatorcontrib>OLDHAM MARK F</creatorcontrib><creatorcontrib>BOEGE STEVEN J</creatorcontrib><creatorcontrib>SANDELL DONALD R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BODNER KEVIN S</au><au>LAU ALDRICH N. K</au><au>PHILLIPS J. MICHAEL</au><au>TRACY DAVID H</au><au>OLDHAM MARK F</au><au>BOEGE STEVEN J</au><au>SANDELL DONALD R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Luminescence reference standards</title><date>2014-02-25</date><risdate>2014</risdate><abstract>The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US8659755B2 |
| source | esp@cenet |
| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS RADIATION PYROMETRY SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TESTING TRANSPORTING |
| title | Luminescence reference standards |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T23%3A09%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BODNER%20KEVIN%20S&rft.date=2014-02-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8659755B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |