Performance
Instruments, devices and methods of analysis are provided which fully integrate a significant number of process steps in a continuous operation. Accurate positioning and full contact between components is also provided by the relative movement the designs allow. An effect interface between a low cos...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | ZENHAUSERN FREDERIC LENIGK RALF YANG JIANING CHEN XIAOJIA LEE-EDGHILL JOHN HOPWOOD ANDREW KOUMI PIERIS MORAN NINA HURTH CEDRIC NORDQUIST ALAN |
| description | Instruments, devices and methods of analysis are provided which fully integrate a significant number of process steps in a continuous operation. Accurate positioning and full contact between components is also provided by the relative movement the designs allow. An effect interface between a low cost disposable cartridge or device and the instrument to process it is also detailed. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8640555B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8640555B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8640555B23</originalsourceid><addsrcrecordid>eNrjZOAOSC1Kyy_KTcxLTuVhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwRZmJgampqZORsZEKAEAvDodOA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Performance</title><source>esp@cenet</source><creator>ZENHAUSERN FREDERIC ; LENIGK RALF ; YANG JIANING ; CHEN XIAOJIA ; LEE-EDGHILL JOHN ; HOPWOOD ANDREW ; KOUMI PIERIS ; MORAN NINA ; HURTH CEDRIC ; NORDQUIST ALAN</creator><creatorcontrib>ZENHAUSERN FREDERIC ; LENIGK RALF ; YANG JIANING ; CHEN XIAOJIA ; LEE-EDGHILL JOHN ; HOPWOOD ANDREW ; KOUMI PIERIS ; MORAN NINA ; HURTH CEDRIC ; NORDQUIST ALAN</creatorcontrib><description>Instruments, devices and methods of analysis are provided which fully integrate a significant number of process steps in a continuous operation. Accurate positioning and full contact between components is also provided by the relative movement the designs allow. An effect interface between a low cost disposable cartridge or device and the instrument to process it is also detailed.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140204&DB=EPODOC&CC=US&NR=8640555B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140204&DB=EPODOC&CC=US&NR=8640555B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZENHAUSERN FREDERIC</creatorcontrib><creatorcontrib>LENIGK RALF</creatorcontrib><creatorcontrib>YANG JIANING</creatorcontrib><creatorcontrib>CHEN XIAOJIA</creatorcontrib><creatorcontrib>LEE-EDGHILL JOHN</creatorcontrib><creatorcontrib>HOPWOOD ANDREW</creatorcontrib><creatorcontrib>KOUMI PIERIS</creatorcontrib><creatorcontrib>MORAN NINA</creatorcontrib><creatorcontrib>HURTH CEDRIC</creatorcontrib><creatorcontrib>NORDQUIST ALAN</creatorcontrib><title>Performance</title><description>Instruments, devices and methods of analysis are provided which fully integrate a significant number of process steps in a continuous operation. Accurate positioning and full contact between components is also provided by the relative movement the designs allow. An effect interface between a low cost disposable cartridge or device and the instrument to process it is also detailed.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAOSC1Kyy_KTcxLTuVhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwRZmJgampqZORsZEKAEAvDodOA</recordid><startdate>20140204</startdate><enddate>20140204</enddate><creator>ZENHAUSERN FREDERIC</creator><creator>LENIGK RALF</creator><creator>YANG JIANING</creator><creator>CHEN XIAOJIA</creator><creator>LEE-EDGHILL JOHN</creator><creator>HOPWOOD ANDREW</creator><creator>KOUMI PIERIS</creator><creator>MORAN NINA</creator><creator>HURTH CEDRIC</creator><creator>NORDQUIST ALAN</creator><scope>EVB</scope></search><sort><creationdate>20140204</creationdate><title>Performance</title><author>ZENHAUSERN FREDERIC ; LENIGK RALF ; YANG JIANING ; CHEN XIAOJIA ; LEE-EDGHILL JOHN ; HOPWOOD ANDREW ; KOUMI PIERIS ; MORAN NINA ; HURTH CEDRIC ; NORDQUIST ALAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8640555B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZENHAUSERN FREDERIC</creatorcontrib><creatorcontrib>LENIGK RALF</creatorcontrib><creatorcontrib>YANG JIANING</creatorcontrib><creatorcontrib>CHEN XIAOJIA</creatorcontrib><creatorcontrib>LEE-EDGHILL JOHN</creatorcontrib><creatorcontrib>HOPWOOD ANDREW</creatorcontrib><creatorcontrib>KOUMI PIERIS</creatorcontrib><creatorcontrib>MORAN NINA</creatorcontrib><creatorcontrib>HURTH CEDRIC</creatorcontrib><creatorcontrib>NORDQUIST ALAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZENHAUSERN FREDERIC</au><au>LENIGK RALF</au><au>YANG JIANING</au><au>CHEN XIAOJIA</au><au>LEE-EDGHILL JOHN</au><au>HOPWOOD ANDREW</au><au>KOUMI PIERIS</au><au>MORAN NINA</au><au>HURTH CEDRIC</au><au>NORDQUIST ALAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Performance</title><date>2014-02-04</date><risdate>2014</risdate><abstract>Instruments, devices and methods of analysis are provided which fully integrate a significant number of process steps in a continuous operation. Accurate positioning and full contact between components is also provided by the relative movement the designs allow. An effect interface between a low cost disposable cartridge or device and the instrument to process it is also detailed.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US8640555B2 |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Performance |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T05%3A01%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZENHAUSERN%20FREDERIC&rft.date=2014-02-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8640555B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |