Lithographic apparatus configured to suppress contamination from passing into the projection system and method

A lithographic apparatus includes a projection system configured to project a patterned beam of radiation onto a substrate. The projection system being provided with an opening through which the patterned beam of radiation may pass. At least part of the opening comprises a sloped surface of a wall o...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: NIENHUYS HAN-KWANG, JONKERS PETER GERARDUS, HUIJBERTS ALEXANDER MARINUS ARNOLDUS
Format: Patent
Sprache:eng
Schlagworte:
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