High lifetime consumable silicon nitride-silicon dioxide plasma processing components

A method of increasing mean time between cleans of a plasma etch chamber and chamber parts lifetimes is provided. Semiconductor substrates are plasma etched in the chamber while using at least one sintered silicon nitride component exposed to ion bombardment and/or ionized halogen gas. The sintered...

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Bibliographische Detailangaben
Hauptverfasser: RAMANUJAM K. Y, TAYLOR TRAVIS R, MIKIJELJ BILJANA, WU SHANGHUA, KADKHODAYAN BOBBY, SRINIVASAN MUKUND
Format: Patent
Sprache:eng
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