Pitch reduction using oxide spacer

A method for etching an etch layer disposed over a substrate and below an antireflective coating (ARC) layer and a patterned organic mask with mask features is provided. The substrate is placed in a process chamber. The ARC layer is opened. An oxide spacer deposition layer is formed. The oxide space...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CHIANG CONAN, KIM JISOO, SHINAGAWA JUN, SADJADI S. M. REZA
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CHIANG CONAN
KIM JISOO
SHINAGAWA JUN
SADJADI S. M. REZA
description A method for etching an etch layer disposed over a substrate and below an antireflective coating (ARC) layer and a patterned organic mask with mask features is provided. The substrate is placed in a process chamber. The ARC layer is opened. An oxide spacer deposition layer is formed. The oxide spacer deposition layer on the organic mask is partially removed, where at least the top portion of the oxide spacer deposition layer is removed. The organic mask and the ARC layer are removed by etching. The etch layer is etched through the sidewalls of the oxide spacer deposition layer. The substrate is removed from the process chamber.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8592318B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8592318B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8592318B23</originalsourceid><addsrcrecordid>eNrjZFAKyCxJzlAoSk0pTS7JzM9TKC3OzEtXyK_ITElVKC5ITE4t4mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqWA1eakl8aHBFqaWRsaGFk5GxkQoAQBytSXl</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Pitch reduction using oxide spacer</title><source>esp@cenet</source><creator>CHIANG CONAN ; KIM JISOO ; SHINAGAWA JUN ; SADJADI S. M. REZA</creator><creatorcontrib>CHIANG CONAN ; KIM JISOO ; SHINAGAWA JUN ; SADJADI S. M. REZA</creatorcontrib><description>A method for etching an etch layer disposed over a substrate and below an antireflective coating (ARC) layer and a patterned organic mask with mask features is provided. The substrate is placed in a process chamber. The ARC layer is opened. An oxide spacer deposition layer is formed. The oxide spacer deposition layer on the organic mask is partially removed, where at least the top portion of the oxide spacer deposition layer is removed. The organic mask and the ARC layer are removed by etching. The etch layer is etched through the sidewalls of the oxide spacer deposition layer. The substrate is removed from the process chamber.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; DECORATIVE ARTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MOSAICS ; PAPERHANGING ; PERFORMING OPERATIONS ; PRODUCING DECORATIVE EFFECTS ; SEMICONDUCTOR DEVICES ; TARSIA WORK ; TRANSPORTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131126&amp;DB=EPODOC&amp;CC=US&amp;NR=8592318B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131126&amp;DB=EPODOC&amp;CC=US&amp;NR=8592318B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHIANG CONAN</creatorcontrib><creatorcontrib>KIM JISOO</creatorcontrib><creatorcontrib>SHINAGAWA JUN</creatorcontrib><creatorcontrib>SADJADI S. M. REZA</creatorcontrib><title>Pitch reduction using oxide spacer</title><description>A method for etching an etch layer disposed over a substrate and below an antireflective coating (ARC) layer and a patterned organic mask with mask features is provided. The substrate is placed in a process chamber. The ARC layer is opened. An oxide spacer deposition layer is formed. The oxide spacer deposition layer on the organic mask is partially removed, where at least the top portion of the oxide spacer deposition layer is removed. The organic mask and the ARC layer are removed by etching. The etch layer is etched through the sidewalls of the oxide spacer deposition layer. The substrate is removed from the process chamber.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>DECORATIVE ARTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MOSAICS</subject><subject>PAPERHANGING</subject><subject>PERFORMING OPERATIONS</subject><subject>PRODUCING DECORATIVE EFFECTS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TARSIA WORK</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAKyCxJzlAoSk0pTS7JzM9TKC3OzEtXyK_ITElVKC5ITE4t4mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqWA1eakl8aHBFqaWRsaGFk5GxkQoAQBytSXl</recordid><startdate>20131126</startdate><enddate>20131126</enddate><creator>CHIANG CONAN</creator><creator>KIM JISOO</creator><creator>SHINAGAWA JUN</creator><creator>SADJADI S. M. REZA</creator><scope>EVB</scope></search><sort><creationdate>20131126</creationdate><title>Pitch reduction using oxide spacer</title><author>CHIANG CONAN ; KIM JISOO ; SHINAGAWA JUN ; SADJADI S. M. REZA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8592318B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>DECORATIVE ARTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MOSAICS</topic><topic>PAPERHANGING</topic><topic>PERFORMING OPERATIONS</topic><topic>PRODUCING DECORATIVE EFFECTS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TARSIA WORK</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHIANG CONAN</creatorcontrib><creatorcontrib>KIM JISOO</creatorcontrib><creatorcontrib>SHINAGAWA JUN</creatorcontrib><creatorcontrib>SADJADI S. M. REZA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHIANG CONAN</au><au>KIM JISOO</au><au>SHINAGAWA JUN</au><au>SADJADI S. M. REZA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Pitch reduction using oxide spacer</title><date>2013-11-26</date><risdate>2013</risdate><abstract>A method for etching an etch layer disposed over a substrate and below an antireflective coating (ARC) layer and a patterned organic mask with mask features is provided. The substrate is placed in a process chamber. The ARC layer is opened. An oxide spacer deposition layer is formed. The oxide spacer deposition layer on the organic mask is partially removed, where at least the top portion of the oxide spacer deposition layer is removed. The organic mask and the ARC layer are removed by etching. The etch layer is etched through the sidewalls of the oxide spacer deposition layer. The substrate is removed from the process chamber.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US8592318B2
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
DECORATIVE ARTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MOSAICS
PAPERHANGING
PERFORMING OPERATIONS
PRODUCING DECORATIVE EFFECTS
SEMICONDUCTOR DEVICES
TARSIA WORK
TRANSPORTING
title Pitch reduction using oxide spacer
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T10%3A15%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHIANG%20CONAN&rft.date=2013-11-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8592318B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true