Selectable repair pass masking

Selectable repair pass masking

The present invention relates to a method and circuit for selectively repairing an embedded memory module having memory elements in an integrated circuit chip. The method includes performing a plurality of tests on the embedded memory module under operating conditions to identify a plurality of non-...

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Hauptverfasser: GOSS JOHN ROBERT, GORMAN KEVIN WILLIAM, PERRY TROY JOSEPH, ZIEGERHOFER MICHAEL ANTHONY, OUELLETTE MICHAEL RICHARD
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator GOSS JOHN ROBERT
GORMAN KEVIN WILLIAM
PERRY TROY JOSEPH
ZIEGERHOFER MICHAEL ANTHONY
OUELLETTE MICHAEL RICHARD
description The present invention relates to a method and circuit for selectively repairing an embedded memory module having memory elements in an integrated circuit chip. The method includes performing a plurality of tests on the embedded memory module under operating conditions to identify a plurality of non-operational memory elements in the embedded memory module and, in response to identifying the non-operational memory elements, generating a plurality of corresponding repair solutions. The method further includes storing the plurality of corresponding repair solutions in a non-volatile storage element and determining from a mask a subset of the plurality of repair solutions that should be restored.
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subjects INFORMATION STORAGE
PHYSICS
STATIC STORES
title Selectable repair pass masking
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