Semiconductor device, semiconductor device testing method, and data processing system
To include one or a plurality of internal signal lines that electrically connects an interface chip to a core chip. The interface chip includes a first circuit that outputs a current to an internal wiring and the core chip includes a second circuit that outputs a current to the first internal signal...
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| creator | EGUCHI TAKANORI YOKO HIDEYUKI IDE AKIRA SHIBATA KAYOKO SHIGEZANE YASUYUKI TANAMACHI KENICHI OGAWA NAOKI HIDAKA KAZUO |
| description | To include one or a plurality of internal signal lines that electrically connects an interface chip to a core chip. The interface chip includes a first circuit that outputs a current to an internal wiring and the core chip includes a second circuit that outputs a current to the first internal signal line. The interface chip includes a determination circuit that has a first input terminal connected to the internal wiring through which the current outputted by the first circuit flows and a second input terminal connected to an end of the first internal signal line in the interface chip, and outputs a voltage according to a potential difference between a voltage of the first input terminal and a voltage of the second input terminal. |
| format | Patent |
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| subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INFORMATION STORAGE PHYSICS SEMICONDUCTOR DEVICES STATIC STORES |
| title | Semiconductor device, semiconductor device testing method, and data processing system |
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