Enhanced capacitance trench capacitor

An integrated circuit including a trench capacitor has a semiconductor region in which a material composition varies in a quantity of at least one component therein such that the quantity alternates with depth a plurality of times between at least two different values. For example, a concentration o...

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Hauptverfasser: NORUM JAMES P, NAEEM MUNIR D, CHENG KANGGUO, KIM BYEONG Y
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creator NORUM JAMES P
NAEEM MUNIR D
CHENG KANGGUO
KIM BYEONG Y
description An integrated circuit including a trench capacitor has a semiconductor region in which a material composition varies in a quantity of at least one component therein such that the quantity alternates with depth a plurality of times between at least two different values. For example, a concentration of a dopant or a weight percentage of a second semiconductor material, such as germanium, in a semiconductor alloy can alternate between with depth a plurality of times between higher and lower values. The trench capacitor has an undulating capacitor dielectric layer, wherein the undulations of the capacitor dielectric layer are at least partly determined by the undulating interior surface of the trench. Such trench capacitor can provide enhanced capacitance, and can be incorporated in a memory cell such as a dynamic random access memory ("DRAM") cell, for example.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8492821B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8492821B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8492821B23</originalsourceid><addsrcrecordid>eNrjZFB1zctIzEtOTVFITixITM4sAXEUSopS85IzYEL5RTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrUYqCo1L7UkPjTYwsTSyMLI0MnImAglAPgbJv4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Enhanced capacitance trench capacitor</title><source>esp@cenet</source><creator>NORUM JAMES P ; NAEEM MUNIR D ; CHENG KANGGUO ; KIM BYEONG Y</creator><creatorcontrib>NORUM JAMES P ; NAEEM MUNIR D ; CHENG KANGGUO ; KIM BYEONG Y</creatorcontrib><description>An integrated circuit including a trench capacitor has a semiconductor region in which a material composition varies in a quantity of at least one component therein such that the quantity alternates with depth a plurality of times between at least two different values. For example, a concentration of a dopant or a weight percentage of a second semiconductor material, such as germanium, in a semiconductor alloy can alternate between with depth a plurality of times between higher and lower values. The trench capacitor has an undulating capacitor dielectric layer, wherein the undulations of the capacitor dielectric layer are at least partly determined by the undulating interior surface of the trench. Such trench capacitor can provide enhanced capacitance, and can be incorporated in a memory cell such as a dynamic random access memory ("DRAM") cell, for example.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130723&amp;DB=EPODOC&amp;CC=US&amp;NR=8492821B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130723&amp;DB=EPODOC&amp;CC=US&amp;NR=8492821B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NORUM JAMES P</creatorcontrib><creatorcontrib>NAEEM MUNIR D</creatorcontrib><creatorcontrib>CHENG KANGGUO</creatorcontrib><creatorcontrib>KIM BYEONG Y</creatorcontrib><title>Enhanced capacitance trench capacitor</title><description>An integrated circuit including a trench capacitor has a semiconductor region in which a material composition varies in a quantity of at least one component therein such that the quantity alternates with depth a plurality of times between at least two different values. For example, a concentration of a dopant or a weight percentage of a second semiconductor material, such as germanium, in a semiconductor alloy can alternate between with depth a plurality of times between higher and lower values. The trench capacitor has an undulating capacitor dielectric layer, wherein the undulations of the capacitor dielectric layer are at least partly determined by the undulating interior surface of the trench. Such trench capacitor can provide enhanced capacitance, and can be incorporated in a memory cell such as a dynamic random access memory ("DRAM") cell, for example.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB1zctIzEtOTVFITixITM4sAXEUSopS85IzYEL5RTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrUYqCo1L7UkPjTYwsTSyMLI0MnImAglAPgbJv4</recordid><startdate>20130723</startdate><enddate>20130723</enddate><creator>NORUM JAMES P</creator><creator>NAEEM MUNIR D</creator><creator>CHENG KANGGUO</creator><creator>KIM BYEONG Y</creator><scope>EVB</scope></search><sort><creationdate>20130723</creationdate><title>Enhanced capacitance trench capacitor</title><author>NORUM JAMES P ; NAEEM MUNIR D ; CHENG KANGGUO ; KIM BYEONG Y</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8492821B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>NORUM JAMES P</creatorcontrib><creatorcontrib>NAEEM MUNIR D</creatorcontrib><creatorcontrib>CHENG KANGGUO</creatorcontrib><creatorcontrib>KIM BYEONG Y</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NORUM JAMES P</au><au>NAEEM MUNIR D</au><au>CHENG KANGGUO</au><au>KIM BYEONG Y</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Enhanced capacitance trench capacitor</title><date>2013-07-23</date><risdate>2013</risdate><abstract>An integrated circuit including a trench capacitor has a semiconductor region in which a material composition varies in a quantity of at least one component therein such that the quantity alternates with depth a plurality of times between at least two different values. For example, a concentration of a dopant or a weight percentage of a second semiconductor material, such as germanium, in a semiconductor alloy can alternate between with depth a plurality of times between higher and lower values. The trench capacitor has an undulating capacitor dielectric layer, wherein the undulations of the capacitor dielectric layer are at least partly determined by the undulating interior surface of the trench. Such trench capacitor can provide enhanced capacitance, and can be incorporated in a memory cell such as a dynamic random access memory ("DRAM") cell, for example.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Enhanced capacitance trench capacitor
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T23%3A23%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NORUM%20JAMES%20P&rft.date=2013-07-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8492821B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true