Degradation sensor
A sensor for monitoring a structure or material. The sensor has a continuous elongate conducting member embedded in an insulating material and a conductivity or resistance meter. The insulating material has one or more gaps that expose the conducting member without allowing direct contact between th...
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creator | WILSON ALAN RICHARD |
description | A sensor for monitoring a structure or material. The sensor has a continuous elongate conducting member embedded in an insulating material and a conductivity or resistance meter. The insulating material has one or more gaps that expose the conducting member without allowing direct contact between the insulating material and the structure or material when the sensor is placed against the structure or material. The meter is arranged to monitor conductivity or resistance between the conducting member and the structure or material being monitored, and/or between two regions of the conducting member. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8400172B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8400172B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8400172B23</originalsourceid><addsrcrecordid>eNrjZBBySU0vSkxJLMnMz1MoTs0rzi_iYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocEWJgYGhuZGTkbGRCgBAMo9H9M</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Degradation sensor</title><source>esp@cenet</source><creator>WILSON ALAN RICHARD</creator><creatorcontrib>WILSON ALAN RICHARD</creatorcontrib><description>A sensor for monitoring a structure or material. The sensor has a continuous elongate conducting member embedded in an insulating material and a conductivity or resistance meter. The insulating material has one or more gaps that expose the conducting member without allowing direct contact between the insulating material and the structure or material when the sensor is placed against the structure or material. The meter is arranged to monitor conductivity or resistance between the conducting member and the structure or material being monitored, and/or between two regions of the conducting member.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130319&DB=EPODOC&CC=US&NR=8400172B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130319&DB=EPODOC&CC=US&NR=8400172B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WILSON ALAN RICHARD</creatorcontrib><title>Degradation sensor</title><description>A sensor for monitoring a structure or material. The sensor has a continuous elongate conducting member embedded in an insulating material and a conductivity or resistance meter. The insulating material has one or more gaps that expose the conducting member without allowing direct contact between the insulating material and the structure or material when the sensor is placed against the structure or material. The meter is arranged to monitor conductivity or resistance between the conducting member and the structure or material being monitored, and/or between two regions of the conducting member.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBBySU0vSkxJLMnMz1MoTs0rzi_iYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocEWJgYGhuZGTkbGRCgBAMo9H9M</recordid><startdate>20130319</startdate><enddate>20130319</enddate><creator>WILSON ALAN RICHARD</creator><scope>EVB</scope></search><sort><creationdate>20130319</creationdate><title>Degradation sensor</title><author>WILSON ALAN RICHARD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8400172B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WILSON ALAN RICHARD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WILSON ALAN RICHARD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Degradation sensor</title><date>2013-03-19</date><risdate>2013</risdate><abstract>A sensor for monitoring a structure or material. The sensor has a continuous elongate conducting member embedded in an insulating material and a conductivity or resistance meter. The insulating material has one or more gaps that expose the conducting member without allowing direct contact between the insulating material and the structure or material when the sensor is placed against the structure or material. The meter is arranged to monitor conductivity or resistance between the conducting member and the structure or material being monitored, and/or between two regions of the conducting member.</abstract><oa>free_for_read</oa></addata></record> |
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language | eng |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Degradation sensor |
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