Method for recording critical patterns with different mark lengths onto optical storage medium and related controller thereof

An exemplary method for recording a first mark with a first length and a second mark with a second length onto an optical storage medium includes: when recording of the first mark requires a power transition from a first laser power level to a second laser power level, making a specific control sign...

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Bibliographische Detailangaben
Hauptverfasser: CHANG YOU-WEN, CHAN YI-SUNG
Format: Patent
Sprache:eng
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