In-situ conditioning in mass spectrometer systems
In a mass spectrometer or gas chromatograph/mass spectrometer system, a conditioning gas such as, for example, hydrogen is added to condition or clean one or more components or regions of the mass spectrometer such as the ion source. The conditioning gas may be added upstream of the mass spectromete...
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creator | QUIMBY BRUCE D PREST HARRY F FREED MICHAEL K SZELEWSKI MICHAEL J |
description | In a mass spectrometer or gas chromatograph/mass spectrometer system, a conditioning gas such as, for example, hydrogen is added to condition or clean one or more components or regions of the mass spectrometer such as the ion source. The conditioning gas may be added upstream of the mass spectrometer such as, for example, into a sample inlet or a chromatographic column, or may be added directly into the mass spectrometer. The conditioning gas may be added off-line, when the mass spectrometer is not analyzing a sample, or on-line during sample analysis. When added on-line, the conditioning gas may be mixed with a carrier gas such as, for example, helium. In another embodiment, the conditioning gas also serves as the carrier gas through the column; another gas such as, for example, helium may be added to the carrier gas stream. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8378293B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8378293B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8378293B13</originalsourceid><addsrcrecordid>eNrjZDD0zNMtziwpVUjOz0vJLMnMz8vMS1fIzFPITSwuViguSE0uKcrPTS1JLVIoriwuSc0t5mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBFsbmFkaWxk6GxkQoAQB0RywG</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>In-situ conditioning in mass spectrometer systems</title><source>esp@cenet</source><creator>QUIMBY BRUCE D ; PREST HARRY F ; FREED MICHAEL K ; SZELEWSKI MICHAEL J</creator><creatorcontrib>QUIMBY BRUCE D ; PREST HARRY F ; FREED MICHAEL K ; SZELEWSKI MICHAEL J</creatorcontrib><description>In a mass spectrometer or gas chromatograph/mass spectrometer system, a conditioning gas such as, for example, hydrogen is added to condition or clean one or more components or regions of the mass spectrometer such as the ion source. The conditioning gas may be added upstream of the mass spectrometer such as, for example, into a sample inlet or a chromatographic column, or may be added directly into the mass spectrometer. The conditioning gas may be added off-line, when the mass spectrometer is not analyzing a sample, or on-line during sample analysis. When added on-line, the conditioning gas may be mixed with a carrier gas such as, for example, helium. In another embodiment, the conditioning gas also serves as the carrier gas through the column; another gas such as, for example, helium may be added to the carrier gas stream.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; SEPARATION ; TRANSPORTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130219&DB=EPODOC&CC=US&NR=8378293B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130219&DB=EPODOC&CC=US&NR=8378293B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>QUIMBY BRUCE D</creatorcontrib><creatorcontrib>PREST HARRY F</creatorcontrib><creatorcontrib>FREED MICHAEL K</creatorcontrib><creatorcontrib>SZELEWSKI MICHAEL J</creatorcontrib><title>In-situ conditioning in mass spectrometer systems</title><description>In a mass spectrometer or gas chromatograph/mass spectrometer system, a conditioning gas such as, for example, hydrogen is added to condition or clean one or more components or regions of the mass spectrometer such as the ion source. The conditioning gas may be added upstream of the mass spectrometer such as, for example, into a sample inlet or a chromatographic column, or may be added directly into the mass spectrometer. The conditioning gas may be added off-line, when the mass spectrometer is not analyzing a sample, or on-line during sample analysis. When added on-line, the conditioning gas may be mixed with a carrier gas such as, for example, helium. In another embodiment, the conditioning gas also serves as the carrier gas through the column; another gas such as, for example, helium may be added to the carrier gas stream.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>SEPARATION</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD0zNMtziwpVUjOz0vJLMnMz8vMS1fIzFPITSwuViguSE0uKcrPTS1JLVIoriwuSc0t5mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBFsbmFkaWxk6GxkQoAQB0RywG</recordid><startdate>20130219</startdate><enddate>20130219</enddate><creator>QUIMBY BRUCE D</creator><creator>PREST HARRY F</creator><creator>FREED MICHAEL K</creator><creator>SZELEWSKI MICHAEL J</creator><scope>EVB</scope></search><sort><creationdate>20130219</creationdate><title>In-situ conditioning in mass spectrometer systems</title><author>QUIMBY BRUCE D ; PREST HARRY F ; FREED MICHAEL K ; SZELEWSKI MICHAEL J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8378293B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>SEPARATION</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>QUIMBY BRUCE D</creatorcontrib><creatorcontrib>PREST HARRY F</creatorcontrib><creatorcontrib>FREED MICHAEL K</creatorcontrib><creatorcontrib>SZELEWSKI MICHAEL J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>QUIMBY BRUCE D</au><au>PREST HARRY F</au><au>FREED MICHAEL K</au><au>SZELEWSKI MICHAEL J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>In-situ conditioning in mass spectrometer systems</title><date>2013-02-19</date><risdate>2013</risdate><abstract>In a mass spectrometer or gas chromatograph/mass spectrometer system, a conditioning gas such as, for example, hydrogen is added to condition or clean one or more components or regions of the mass spectrometer such as the ion source. The conditioning gas may be added upstream of the mass spectrometer such as, for example, into a sample inlet or a chromatographic column, or may be added directly into the mass spectrometer. The conditioning gas may be added off-line, when the mass spectrometer is not analyzing a sample, or on-line during sample analysis. When added on-line, the conditioning gas may be mixed with a carrier gas such as, for example, helium. In another embodiment, the conditioning gas also serves as the carrier gas through the column; another gas such as, for example, helium may be added to the carrier gas stream.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL SEPARATION TRANSPORTING |
title | In-situ conditioning in mass spectrometer systems |
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