System for testing at least one electronic control unit and method
The present invention relates to a test device for testing a control system and an associated method for operating the test device. The test device includes an addressable memory. The test device is configured to calculate at least one environment model and to execute at least one test model. The en...
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| creator | LEINFELLNER ROBERT BOERGER RALF G WOELFER THOMAS BRUSKI NICOLA MILLER EDUARD |
| description | The present invention relates to a test device for testing a control system and an associated method for operating the test device. The test device includes an addressable memory. The test device is configured to calculate at least one environment model and to execute at least one test model. The environment model is described by environment model variables whose values are filed at fixed physical addresses in memory locations of the memory. The test device further comprises an allocation unit, in which the allocation of all or a part of the environment model variable to the allocated physical addresses of the memory is filed such that the test model can read the allocation of the environment model variables to their specific memory addresses so as to modify the environment model variable values in the environment model during its execution. |
| format | Patent |
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The test device includes an addressable memory. The test device is configured to calculate at least one environment model and to execute at least one test model. The environment model is described by environment model variables whose values are filed at fixed physical addresses in memory locations of the memory. 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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | System for testing at least one electronic control unit and method |
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