Extraction of component models from PCB channel scattering parameter data by stochastic optimization

Various embodiments herein include one or more of systems, methods, software, and/or data structures to extract models of components (e.g., vias and traces) for PCB channels from measurements (or simulations) taken from physical PCB channels. By applying stochastic optimization to measurements of two PCB channels having different channel lengths, s-matrices (e.g., two-port, four-port, and the like) of the components of a PCB channel may be accurately determined by searching the multi-dimensional parameter space for parameters that comply with the measured values. Once the models for the components have been accurately determined, they may be utilized in constructing a model library that includes component models and is based on physical measurement data.