Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns

A method, apparatus and computer program product are provided for implementing diagnostics of transitional scan chain defects using structural Logic Built In Self Test (LBIST) test patterns. A LBIST test pattern is applied to the device under test and multiple system clock sequences with variable lo...

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Bibliographische Detailangaben

Hauptverfasser:	FORLENZA ORAZIO PASQUALE, FORLENZA DONATO ORAZIO, TRAN PHONG T
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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