Removable pellicle for immersion lithography

A method of irradiating to pattern a photosensitive layer such as a resist (L2) immersed in a fluid (L3), involves applying a removable transparent layer (L4, L5), projecting the radiation onto the resist through the immersion fluid and through the transparent layer, such that imperfections in the f...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: DIRKSEN PETER, VAN STEENWINCKEL DAVID, AKSENOV YURI, LAMMERS JEROEN HERMAN, MORTON ROBERT DUNCAN, VAN WINGERDEN JOHANNES, MARINIER LAURENT, ZANDBERGEN PETER
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator DIRKSEN PETER
VAN STEENWINCKEL DAVID
AKSENOV YURI
LAMMERS JEROEN HERMAN
MORTON ROBERT DUNCAN
VAN WINGERDEN JOHANNES
MARINIER LAURENT
ZANDBERGEN PETER
description A method of irradiating to pattern a photosensitive layer such as a resist (L2) immersed in a fluid (L3), involves applying a removable transparent layer (L4, L5), projecting the radiation onto the resist through the immersion fluid and through the transparent layer, such that imperfections in the fluid are out of focus as projected on the surface, and subsequently removing the transparent layer. The transparent layer can help distance such imperfections from the focus of the radiation on the surface and so can reduce or eliminate shadowing. Hence the irradiation can be more complete, and defects reduced. It can be particularly effective for imperfections in the form of small bubbles or particles in the immersion fluid especially at the fluid/surface interface for example. The radiation can be for any purpose including inspection, processing, patterning and so on. The removal of the transparent layer can be combined with a step of developing the resist layer.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8067147B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8067147B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8067147B23</originalsourceid><addsrcrecordid>eNrjZNAJSs3NL0tMyklVKEjNyclMBjLS8osUMnNzU4uKM_PzFHIySzLy04sSCzIqeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwhYGZuaGJuZORMRFKAHgsKhM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Removable pellicle for immersion lithography</title><source>esp@cenet</source><creator>DIRKSEN PETER ; VAN STEENWINCKEL DAVID ; AKSENOV YURI ; LAMMERS JEROEN HERMAN ; MORTON ROBERT DUNCAN ; VAN WINGERDEN JOHANNES ; MARINIER LAURENT ; ZANDBERGEN PETER</creator><creatorcontrib>DIRKSEN PETER ; VAN STEENWINCKEL DAVID ; AKSENOV YURI ; LAMMERS JEROEN HERMAN ; MORTON ROBERT DUNCAN ; VAN WINGERDEN JOHANNES ; MARINIER LAURENT ; ZANDBERGEN PETER</creatorcontrib><description>A method of irradiating to pattern a photosensitive layer such as a resist (L2) immersed in a fluid (L3), involves applying a removable transparent layer (L4, L5), projecting the radiation onto the resist through the immersion fluid and through the transparent layer, such that imperfections in the fluid are out of focus as projected on the surface, and subsequently removing the transparent layer. The transparent layer can help distance such imperfections from the focus of the radiation on the surface and so can reduce or eliminate shadowing. Hence the irradiation can be more complete, and defects reduced. It can be particularly effective for imperfections in the form of small bubbles or particles in the immersion fluid especially at the fluid/surface interface for example. The radiation can be for any purpose including inspection, processing, patterning and so on. The removal of the transparent layer can be combined with a step of developing the resist layer.</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20111129&amp;DB=EPODOC&amp;CC=US&amp;NR=8067147B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,782,887,25571,76555</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20111129&amp;DB=EPODOC&amp;CC=US&amp;NR=8067147B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DIRKSEN PETER</creatorcontrib><creatorcontrib>VAN STEENWINCKEL DAVID</creatorcontrib><creatorcontrib>AKSENOV YURI</creatorcontrib><creatorcontrib>LAMMERS JEROEN HERMAN</creatorcontrib><creatorcontrib>MORTON ROBERT DUNCAN</creatorcontrib><creatorcontrib>VAN WINGERDEN JOHANNES</creatorcontrib><creatorcontrib>MARINIER LAURENT</creatorcontrib><creatorcontrib>ZANDBERGEN PETER</creatorcontrib><title>Removable pellicle for immersion lithography</title><description>A method of irradiating to pattern a photosensitive layer such as a resist (L2) immersed in a fluid (L3), involves applying a removable transparent layer (L4, L5), projecting the radiation onto the resist through the immersion fluid and through the transparent layer, such that imperfections in the fluid are out of focus as projected on the surface, and subsequently removing the transparent layer. The transparent layer can help distance such imperfections from the focus of the radiation on the surface and so can reduce or eliminate shadowing. Hence the irradiation can be more complete, and defects reduced. It can be particularly effective for imperfections in the form of small bubbles or particles in the immersion fluid especially at the fluid/surface interface for example. The radiation can be for any purpose including inspection, processing, patterning and so on. The removal of the transparent layer can be combined with a step of developing the resist layer.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAJSs3NL0tMyklVKEjNyclMBjLS8osUMnNzU4uKM_PzFHIySzLy04sSCzIqeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwhYGZuaGJuZORMRFKAHgsKhM</recordid><startdate>20111129</startdate><enddate>20111129</enddate><creator>DIRKSEN PETER</creator><creator>VAN STEENWINCKEL DAVID</creator><creator>AKSENOV YURI</creator><creator>LAMMERS JEROEN HERMAN</creator><creator>MORTON ROBERT DUNCAN</creator><creator>VAN WINGERDEN JOHANNES</creator><creator>MARINIER LAURENT</creator><creator>ZANDBERGEN PETER</creator><scope>EVB</scope></search><sort><creationdate>20111129</creationdate><title>Removable pellicle for immersion lithography</title><author>DIRKSEN PETER ; VAN STEENWINCKEL DAVID ; AKSENOV YURI ; LAMMERS JEROEN HERMAN ; MORTON ROBERT DUNCAN ; VAN WINGERDEN JOHANNES ; MARINIER LAURENT ; ZANDBERGEN PETER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8067147B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>DIRKSEN PETER</creatorcontrib><creatorcontrib>VAN STEENWINCKEL DAVID</creatorcontrib><creatorcontrib>AKSENOV YURI</creatorcontrib><creatorcontrib>LAMMERS JEROEN HERMAN</creatorcontrib><creatorcontrib>MORTON ROBERT DUNCAN</creatorcontrib><creatorcontrib>VAN WINGERDEN JOHANNES</creatorcontrib><creatorcontrib>MARINIER LAURENT</creatorcontrib><creatorcontrib>ZANDBERGEN PETER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DIRKSEN PETER</au><au>VAN STEENWINCKEL DAVID</au><au>AKSENOV YURI</au><au>LAMMERS JEROEN HERMAN</au><au>MORTON ROBERT DUNCAN</au><au>VAN WINGERDEN JOHANNES</au><au>MARINIER LAURENT</au><au>ZANDBERGEN PETER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Removable pellicle for immersion lithography</title><date>2011-11-29</date><risdate>2011</risdate><abstract>A method of irradiating to pattern a photosensitive layer such as a resist (L2) immersed in a fluid (L3), involves applying a removable transparent layer (L4, L5), projecting the radiation onto the resist through the immersion fluid and through the transparent layer, such that imperfections in the fluid are out of focus as projected on the surface, and subsequently removing the transparent layer. The transparent layer can help distance such imperfections from the focus of the radiation on the surface and so can reduce or eliminate shadowing. Hence the irradiation can be more complete, and defects reduced. It can be particularly effective for imperfections in the form of small bubbles or particles in the immersion fluid especially at the fluid/surface interface for example. The radiation can be for any purpose including inspection, processing, patterning and so on. The removal of the transparent layer can be combined with a step of developing the resist layer.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US8067147B2
source esp@cenet
subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
title Removable pellicle for immersion lithography
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T22%3A29%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DIRKSEN%20PETER&rft.date=2011-11-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8067147B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true