System and method for correlating photoreceptor pigmented film layer to electrical performance

System and method for correlating photoreceptor pigmented film layer to electrical performance

The presently disclosed embodiments are directed to a system and method for obtaining spectra of highly scattering pigmented layers and providing a spectral reflection ratio, which can be correlated to photoreceptor electrical performance. The present embodiments employ the use of dark field microsc...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ZAMAN KAMRAN U, HERKO JONATHAN H, GRIFFIN SCOTT J, ROETKER MICHAEL S, PIETRANTONI DANTE M
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:The presently disclosed embodiments are directed to a system and method for obtaining spectra of highly scattering pigmented layers and providing a spectral reflection ratio, which can be correlated to photoreceptor electrical performance. The present embodiments employ the use of dark field microscopy in combination with a noise reducing normalization technique to provide real-time production adjustments to optimize photoreceptor characteristics and/or performance.