Subsystem of an illumination system of a microlithographic projection exposure apparatus

In general, in one aspect, the disclosure features an illumination system for a microlithographic projection exposure apparatus configured so that during operation the illumination system illuminates a reticle plane of the microlithographic projection exposure apparatus with light of a desired polar...

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description In general, in one aspect, the disclosure features an illumination system for a microlithographic projection exposure apparatus configured so that during operation the illumination system illuminates a reticle plane of the microlithographic projection exposure apparatus with light of a desired polarization distribution. The illumination system includes a first polarization-influencing optical element and a second polarization-influencing optical element. During operation the first polarization-influencing optical element converts a first polarization distribution produced by a light source unit into a second polarization distribution which is different from the first polarization distribution. The second polarization-influencing optical element converts the second polarization distribution into a third polarization distribution corresponding to the desired polarization distribution, the second polarization-influencing optical element causing an effective rotation of the preferred polarization direction through 90° over its optically effective surface.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US8035803B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US8035803B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US8035803B23</originalsourceid><addsrcrecordid>eNqNijEKAjEQANNYiPqH_YAgHoK1otifgt2xhj1vjyS7ZBPQ3ytiYWkxTDEzdde23uxphSJID5iAQ6iRExaWBD8FIvssgcsg94w6sAfNMpL_jPRQsZoJUBUzlmpzN-kxGC2-njk4Hs7705JUOjJFT4lKd2m3q2bzZrdu_lhewsc7Sw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Subsystem of an illumination system of a microlithographic projection exposure apparatus</title><source>esp@cenet</source><creator>FIOLKA DAMIAN</creator><creatorcontrib>FIOLKA DAMIAN</creatorcontrib><description>In general, in one aspect, the disclosure features an illumination system for a microlithographic projection exposure apparatus configured so that during operation the illumination system illuminates a reticle plane of the microlithographic projection exposure apparatus with light of a desired polarization distribution. The illumination system includes a first polarization-influencing optical element and a second polarization-influencing optical element. During operation the first polarization-influencing optical element converts a first polarization distribution produced by a light source unit into a second polarization distribution which is different from the first polarization distribution. The second polarization-influencing optical element converts the second polarization distribution into a third polarization distribution corresponding to the desired polarization distribution, the second polarization-influencing optical element causing an effective rotation of the preferred polarization direction through 90° over its optically effective surface.</description><language>eng</language><subject>ACCESSORIES THEREFOR ; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES ; APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; PHOTOGRAPHY ; PHYSICS</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20111011&amp;DB=EPODOC&amp;CC=US&amp;NR=8035803B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20111011&amp;DB=EPODOC&amp;CC=US&amp;NR=8035803B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FIOLKA DAMIAN</creatorcontrib><title>Subsystem of an illumination system of a microlithographic projection exposure apparatus</title><description>In general, in one aspect, the disclosure features an illumination system for a microlithographic projection exposure apparatus configured so that during operation the illumination system illuminates a reticle plane of the microlithographic projection exposure apparatus with light of a desired polarization distribution. The illumination system includes a first polarization-influencing optical element and a second polarization-influencing optical element. During operation the first polarization-influencing optical element converts a first polarization distribution produced by a light source unit into a second polarization distribution which is different from the first polarization distribution. The second polarization-influencing optical element converts the second polarization distribution into a third polarization distribution corresponding to the desired polarization distribution, the second polarization-influencing optical element causing an effective rotation of the preferred polarization direction through 90° over its optically effective surface.</description><subject>ACCESSORIES THEREFOR</subject><subject>APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES</subject><subject>APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>PHOTOGRAPHY</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijEKAjEQANNYiPqH_YAgHoK1otifgt2xhj1vjyS7ZBPQ3ytiYWkxTDEzdde23uxphSJID5iAQ6iRExaWBD8FIvssgcsg94w6sAfNMpL_jPRQsZoJUBUzlmpzN-kxGC2-njk4Hs7705JUOjJFT4lKd2m3q2bzZrdu_lhewsc7Sw</recordid><startdate>20111011</startdate><enddate>20111011</enddate><creator>FIOLKA DAMIAN</creator><scope>EVB</scope></search><sort><creationdate>20111011</creationdate><title>Subsystem of an illumination system of a microlithographic projection exposure apparatus</title><author>FIOLKA DAMIAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US8035803B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>ACCESSORIES THEREFOR</topic><topic>APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES</topic><topic>APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>PHOTOGRAPHY</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>FIOLKA DAMIAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FIOLKA DAMIAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Subsystem of an illumination system of a microlithographic projection exposure apparatus</title><date>2011-10-11</date><risdate>2011</risdate><abstract>In general, in one aspect, the disclosure features an illumination system for a microlithographic projection exposure apparatus configured so that during operation the illumination system illuminates a reticle plane of the microlithographic projection exposure apparatus with light of a desired polarization distribution. The illumination system includes a first polarization-influencing optical element and a second polarization-influencing optical element. During operation the first polarization-influencing optical element converts a first polarization distribution produced by a light source unit into a second polarization distribution which is different from the first polarization distribution. The second polarization-influencing optical element converts the second polarization distribution into a third polarization distribution corresponding to the desired polarization distribution, the second polarization-influencing optical element causing an effective rotation of the preferred polarization direction through 90° over its optically effective surface.</abstract><oa>free_for_read</oa></addata></record>
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subjects ACCESSORIES THEREFOR
APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES
APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
PHOTOGRAPHY
PHYSICS
title Subsystem of an illumination system of a microlithographic projection exposure apparatus
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T13%3A58%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=FIOLKA%20DAMIAN&rft.date=2011-10-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS8035803B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true