Method and system to monitor, debug, and analyze performance of an electronic design

Various methods and apparatuses are described that provide instrumentation and analysis of an electronic design. A performance monitoring apparatus may be located on an interconnect of a fabricated integrated circuit. An event measurement module (EM) includes an event generator sub-module that gener...

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Bibliographische Detailangaben

Hauptverfasser:	CHAUVET PASCAL, CHOU CHIENUN, HAMILTON STEPHEN W, WINGARD DREW E
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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