Techniques for obtaining a specified lifetime for a data storage device

Techniques for obtaining a specified lifetime for a data storage device

Described are techniques for processing requests for a device. One embodiment is directed to a method including receiving a first value indicating an expected usage of said device prior to failure of said device, receiving a second value indicated a specified lifetime of said device, said second val...

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Hauptverfasser: MORE SACHIN, CHILTON KENDELL A
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator MORE SACHIN
CHILTON KENDELL A
description Described are techniques for processing requests for a device. One embodiment is directed to a method including receiving a first value indicating an expected usage of said device prior to failure of said device, receiving a second value indicated a specified lifetime of said device, said second value being in units of time, determining a target rate of usage for the device in accordance with said first value and said second value, determining a current rate of usage for the device, determining whether the current rate of usage is greater than the target rate of usage; and, if said current rate of usage is greater than the target rate of usage, performing an action to reduce the current rate of usage for the device.
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One embodiment is directed to a method including receiving a first value indicating an expected usage of said device prior to failure of said device, receiving a second value indicated a specified lifetime of said device, said second value being in units of time, determining a target rate of usage for the device in accordance with said first value and said second value, determining a current rate of usage for the device, determining whether the current rate of usage is greater than the target rate of usage; and, if said current rate of usage is greater than the target rate of usage, performing an action to reduce the current rate of usage for the device.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110830&amp;DB=EPODOC&amp;CC=US&amp;NR=8010738B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110830&amp;DB=EPODOC&amp;CC=US&amp;NR=8010738B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MORE SACHIN</creatorcontrib><creatorcontrib>CHILTON KENDELL A</creatorcontrib><title>Techniques for obtaining a specified lifetime for a data storage device</title><description>Described are techniques for processing requests for a device. 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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
title Techniques for obtaining a specified lifetime for a data storage device
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