Industrial automation interfaces integrated with enterprise manufacturing intelligence (EMI) systems

A visualization system integrated with an enterprise manufacturing intelligence (EMI) system utilizing preconfigured EMI data models, workflow reports and process event notifications to optimize a manufacturing process. The visualization system and the EMI system exchange data and information provid...

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Bibliographische Detailangaben
Hauptverfasser: TOOKE IAN EDWARD, PANTALEANO MICHEAL JOHN, ALBERT KEVIN JOHN, BAIER JOHN JOSEPH, MCGREEVY ROBERT JOSEPH, FULLER BRUCE GORDON, PINGEL JAN
Format: Patent
Sprache:eng
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Zusammenfassung:A visualization system integrated with an enterprise manufacturing intelligence (EMI) system utilizing preconfigured EMI data models, workflow reports and process event notifications to optimize a manufacturing process. The visualization system and the EMI system exchange data and information providing both systems with a broader process view than either system has independently. The visualization system can specifically target information and action requests to different classes of manufacturing personnel such as operators and engineers. Additionally, the visualization system maintains an audit log of all production identities, raw material usage, and requested corrective actions.