IC testing methods and apparatus

A method and apparatus for testing an integrated circuit core or circuitry external to an integrated circuit core using a testing circuit passes a test vector from a parallel input of the testing circuit along a shift register circuit. The shift register circuit is configured to bypass one or more c...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	WAAYERS TOM
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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