Method and system for performing a double pass NTH fail bitmap of a device memory

A method for performing a double pass nth fail bitmap of a memory array of a device under test includes a memory built-in test (MBIST) unit reading previously written data from each location of the memory array during a first pass, and detecting a failure associated with a mismatch between written a...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	DAS DEBALEENA
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!