Lithographic apparatus and contamination removal or prevention method
An immersion lithographic apparatus is cleaned by use of a cleaning liquid consisting essentially of ultra-pure water and (a) a mixture of hydrogen peroxide and ozone, or (b) hydrogen peroxide at a concentration of up to 5%, or (c) ozone at a concentration of up to 50 ppm, or (d) oxygen at concentra...
Gespeichert in:
Hauptverfasser: | , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | WANTEN PETER FRANCISCUS JANSEN HANS DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS VAN DER NET ANTONIUS JOHANNUS VAN DER DONCK JACQUES COR JOHAN VAN DEN DOOL TEUNIS CORNELIS CROMWIJK JAN WILLEM LEENDERS MARTINUS HENDRIKUS ANTONIUS SCHUH NADJA WATSO ROBERT DOUGLAS |
description | An immersion lithographic apparatus is cleaned by use of a cleaning liquid consisting essentially of ultra-pure water and (a) a mixture of hydrogen peroxide and ozone, or (b) hydrogen peroxide at a concentration of up to 5%, or (c) ozone at a concentration of up to 50 ppm, or (d) oxygen at concentration of up to 10 ppm, or (e) any combination selected from (a)-(d). |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7916269B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7916269B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7916269B23</originalsourceid><addsrcrecordid>eNqNi0EKwkAMAPfiQdQ_5AMerFDp1VLx4E09l7CNdqGbhGzs-xXxAZ4Ghpll6C7JR3ka6pgioCoa-qsA8gBR2DEnRk_CYJRlxgnEQI1m4q_N9NmHdVg8cCq0-XEV4NTd2vOWVHoqipGYvL9fD82ururmWO3_SN78bDPm</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Lithographic apparatus and contamination removal or prevention method</title><source>esp@cenet</source><creator>WANTEN PETER FRANCISCUS ; JANSEN HANS ; DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS ; VAN DER NET ANTONIUS JOHANNUS ; VAN DER DONCK JACQUES COR JOHAN ; VAN DEN DOOL TEUNIS CORNELIS ; CROMWIJK JAN WILLEM ; LEENDERS MARTINUS HENDRIKUS ANTONIUS ; SCHUH NADJA ; WATSO ROBERT DOUGLAS</creator><creatorcontrib>WANTEN PETER FRANCISCUS ; JANSEN HANS ; DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS ; VAN DER NET ANTONIUS JOHANNUS ; VAN DER DONCK JACQUES COR JOHAN ; VAN DEN DOOL TEUNIS CORNELIS ; CROMWIJK JAN WILLEM ; LEENDERS MARTINUS HENDRIKUS ANTONIUS ; SCHUH NADJA ; WATSO ROBERT DOUGLAS</creatorcontrib><description>An immersion lithographic apparatus is cleaned by use of a cleaning liquid consisting essentially of ultra-pure water and (a) a mixture of hydrogen peroxide and ozone, or (b) hydrogen peroxide at a concentration of up to 5%, or (c) ozone at a concentration of up to 50 ppm, or (d) oxygen at concentration of up to 10 ppm, or (e) any combination selected from (a)-(d).</description><language>eng</language><subject>ACCESSORIES THEREFOR ; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES ; APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM ; APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110329&DB=EPODOC&CC=US&NR=7916269B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110329&DB=EPODOC&CC=US&NR=7916269B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANTEN PETER FRANCISCUS</creatorcontrib><creatorcontrib>JANSEN HANS</creatorcontrib><creatorcontrib>DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS</creatorcontrib><creatorcontrib>VAN DER NET ANTONIUS JOHANNUS</creatorcontrib><creatorcontrib>VAN DER DONCK JACQUES COR JOHAN</creatorcontrib><creatorcontrib>VAN DEN DOOL TEUNIS CORNELIS</creatorcontrib><creatorcontrib>CROMWIJK JAN WILLEM</creatorcontrib><creatorcontrib>LEENDERS MARTINUS HENDRIKUS ANTONIUS</creatorcontrib><creatorcontrib>SCHUH NADJA</creatorcontrib><creatorcontrib>WATSO ROBERT DOUGLAS</creatorcontrib><title>Lithographic apparatus and contamination removal or prevention method</title><description>An immersion lithographic apparatus is cleaned by use of a cleaning liquid consisting essentially of ultra-pure water and (a) a mixture of hydrogen peroxide and ozone, or (b) hydrogen peroxide at a concentration of up to 5%, or (c) ozone at a concentration of up to 50 ppm, or (d) oxygen at concentration of up to 10 ppm, or (e) any combination selected from (a)-(d).</description><subject>ACCESSORIES THEREFOR</subject><subject>APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES</subject><subject>APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM</subject><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi0EKwkAMAPfiQdQ_5AMerFDp1VLx4E09l7CNdqGbhGzs-xXxAZ4Ghpll6C7JR3ka6pgioCoa-qsA8gBR2DEnRk_CYJRlxgnEQI1m4q_N9NmHdVg8cCq0-XEV4NTd2vOWVHoqipGYvL9fD82ururmWO3_SN78bDPm</recordid><startdate>20110329</startdate><enddate>20110329</enddate><creator>WANTEN PETER FRANCISCUS</creator><creator>JANSEN HANS</creator><creator>DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS</creator><creator>VAN DER NET ANTONIUS JOHANNUS</creator><creator>VAN DER DONCK JACQUES COR JOHAN</creator><creator>VAN DEN DOOL TEUNIS CORNELIS</creator><creator>CROMWIJK JAN WILLEM</creator><creator>LEENDERS MARTINUS HENDRIKUS ANTONIUS</creator><creator>SCHUH NADJA</creator><creator>WATSO ROBERT DOUGLAS</creator><scope>EVB</scope></search><sort><creationdate>20110329</creationdate><title>Lithographic apparatus and contamination removal or prevention method</title><author>WANTEN PETER FRANCISCUS ; JANSEN HANS ; DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS ; VAN DER NET ANTONIUS JOHANNUS ; VAN DER DONCK JACQUES COR JOHAN ; VAN DEN DOOL TEUNIS CORNELIS ; CROMWIJK JAN WILLEM ; LEENDERS MARTINUS HENDRIKUS ANTONIUS ; SCHUH NADJA ; WATSO ROBERT DOUGLAS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7916269B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>ACCESSORIES THEREFOR</topic><topic>APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES</topic><topic>APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM</topic><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>WANTEN PETER FRANCISCUS</creatorcontrib><creatorcontrib>JANSEN HANS</creatorcontrib><creatorcontrib>DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS</creatorcontrib><creatorcontrib>VAN DER NET ANTONIUS JOHANNUS</creatorcontrib><creatorcontrib>VAN DER DONCK JACQUES COR JOHAN</creatorcontrib><creatorcontrib>VAN DEN DOOL TEUNIS CORNELIS</creatorcontrib><creatorcontrib>CROMWIJK JAN WILLEM</creatorcontrib><creatorcontrib>LEENDERS MARTINUS HENDRIKUS ANTONIUS</creatorcontrib><creatorcontrib>SCHUH NADJA</creatorcontrib><creatorcontrib>WATSO ROBERT DOUGLAS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANTEN PETER FRANCISCUS</au><au>JANSEN HANS</au><au>DE JONG ANTHONIUS MARTINUS CORNELIS PETRUS</au><au>VAN DER NET ANTONIUS JOHANNUS</au><au>VAN DER DONCK JACQUES COR JOHAN</au><au>VAN DEN DOOL TEUNIS CORNELIS</au><au>CROMWIJK JAN WILLEM</au><au>LEENDERS MARTINUS HENDRIKUS ANTONIUS</au><au>SCHUH NADJA</au><au>WATSO ROBERT DOUGLAS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Lithographic apparatus and contamination removal or prevention method</title><date>2011-03-29</date><risdate>2011</risdate><abstract>An immersion lithographic apparatus is cleaned by use of a cleaning liquid consisting essentially of ultra-pure water and (a) a mixture of hydrogen peroxide and ozone, or (b) hydrogen peroxide at a concentration of up to 5%, or (c) ozone at a concentration of up to 50 ppm, or (d) oxygen at concentration of up to 10 ppm, or (e) any combination selected from (a)-(d).</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US7916269B2 |
source | esp@cenet |
subjects | ACCESSORIES THEREFOR APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES |
title | Lithographic apparatus and contamination removal or prevention method |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T16%3A12%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WANTEN%20PETER%20FRANCISCUS&rft.date=2011-03-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7916269B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |