Method and system for advanced process control using a combination of weighted relative bias values

By directly using relative biases, contained in the relative bias date matrix, and by appropriately weighting the components thereof, sampling rate limitations in an APC control scheme may be efficiently compensated for. In particular embodiments, an age-based weighting factor is established that sc...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: STIRTON JAMES BROC, HOLFELD ANDRE
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator STIRTON JAMES BROC
HOLFELD ANDRE
description By directly using relative biases, contained in the relative bias date matrix, and by appropriately weighting the components thereof, sampling rate limitations in an APC control scheme may be efficiently compensated for. In particular embodiments, an age-based weighting factor is established that scales measurement data uncertainty according to the delay with which the corresponding measurement data for a specific control thread are obtained.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7869894B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7869894B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7869894B23</originalsourceid><addsrcrecordid>eNqNijEOwjAMALMwIOAP_gALIGjXIhALEzBXbuK2kVK7itMifk8GHsB0utMtjb1T6sUBsgP9aKIBWomAbka25GCMYkkVrHCKEmBSzx1g9qHxjMkLg7TwJt_1Kf-RQo4zQeNRYcYwka7NosWgtPlxZeB6eZ5vWxqlJh3RElOqX49TcSyL8lDt9n8sXy-QPoM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and system for advanced process control using a combination of weighted relative bias values</title><source>esp@cenet</source><creator>STIRTON JAMES BROC ; HOLFELD ANDRE</creator><creatorcontrib>STIRTON JAMES BROC ; HOLFELD ANDRE</creatorcontrib><description>By directly using relative biases, contained in the relative bias date matrix, and by appropriately weighting the components thereof, sampling rate limitations in an APC control scheme may be efficiently compensated for. In particular embodiments, an age-based weighting factor is established that scales measurement data uncertainty according to the delay with which the corresponding measurement data for a specific control thread are obtained.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110111&amp;DB=EPODOC&amp;CC=US&amp;NR=7869894B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110111&amp;DB=EPODOC&amp;CC=US&amp;NR=7869894B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STIRTON JAMES BROC</creatorcontrib><creatorcontrib>HOLFELD ANDRE</creatorcontrib><title>Method and system for advanced process control using a combination of weighted relative bias values</title><description>By directly using relative biases, contained in the relative bias date matrix, and by appropriately weighting the components thereof, sampling rate limitations in an APC control scheme may be efficiently compensated for. In particular embodiments, an age-based weighting factor is established that scales measurement data uncertainty according to the delay with which the corresponding measurement data for a specific control thread are obtained.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijEOwjAMALMwIOAP_gALIGjXIhALEzBXbuK2kVK7itMifk8GHsB0utMtjb1T6sUBsgP9aKIBWomAbka25GCMYkkVrHCKEmBSzx1g9qHxjMkLg7TwJt_1Kf-RQo4zQeNRYcYwka7NosWgtPlxZeB6eZ5vWxqlJh3RElOqX49TcSyL8lDt9n8sXy-QPoM</recordid><startdate>20110111</startdate><enddate>20110111</enddate><creator>STIRTON JAMES BROC</creator><creator>HOLFELD ANDRE</creator><scope>EVB</scope></search><sort><creationdate>20110111</creationdate><title>Method and system for advanced process control using a combination of weighted relative bias values</title><author>STIRTON JAMES BROC ; HOLFELD ANDRE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7869894B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>STIRTON JAMES BROC</creatorcontrib><creatorcontrib>HOLFELD ANDRE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STIRTON JAMES BROC</au><au>HOLFELD ANDRE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and system for advanced process control using a combination of weighted relative bias values</title><date>2011-01-11</date><risdate>2011</risdate><abstract>By directly using relative biases, contained in the relative bias date matrix, and by appropriately weighting the components thereof, sampling rate limitations in an APC control scheme may be efficiently compensated for. In particular embodiments, an age-based weighting factor is established that scales measurement data uncertainty according to the delay with which the corresponding measurement data for a specific control thread are obtained.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US7869894B2
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Method and system for advanced process control using a combination of weighted relative bias values
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T20%3A06%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=STIRTON%20JAMES%20BROC&rft.date=2011-01-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7869894B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true