Method for forming a pattern film with a narrower width

A method for forming a pattern film with a narrower width than the resolution of an exposure machine and a resist used independently of etching is provided. The method comprises the steps of: forming a first frame layer having end surfaces facing each other across a space having a width W1; forming...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TERASAWA MAKOTO, ITO NORIYUKI, HASEGAWA YASUHIRO, ISOBE MITSUHARU, GOMI HIROTAKA, YAMANA TAKESHI, FUNADA HIROAKI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!