Methods and apparatus for providing a semiconductor optical flexured mass accelerometer

Methods and apparatus are provided for integrating various optical components onto a planar substrate using a single semiconductor material system to produce an accelerometer. A light beam is generated on the semiconductor optical accelerometer. The light beam is split to form two light beams using...

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Hauptverfasser: TAWNEY JESSE, HAKIMI FARHAD
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HAKIMI FARHAD
description Methods and apparatus are provided for integrating various optical components onto a planar substrate using a single semiconductor material system to produce an accelerometer. A light beam is generated on the semiconductor optical accelerometer. The light beam is split to form two light beams using a multimode interference (MMI) coupler. One of the two light beams that is formed is directed towards a reference mirror and the other is directed towards a flexured mirror. The flexured mirror moves as a result of acceleration and thereby reflects the light beam with a different light beam characteristic. The light beams are combined by the MMI coupler to produce an interference light beam. A microprocessor measures acceleration based on the differences in light beam characteristics of the reflected light beams. Along the optical path light beam detectors measure various beam characteristics. The microprocessor accounts for characteristics measured by the detectors when computing acceleration.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7808618B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7808618B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7808618B13</originalsourceid><addsrcrecordid>eNqNjD0KAjEUBrexEPUO7wKCi6CpFcXGSsVyeSRf3ECSF_IjHt8tPIDVFDPMvHteUUcxhTga4pQ4c22FrGRKWd7OuPgipoLgtETTdJ2MpOo0e7Ien5ZhKHCZDlrDI0tARV52M8u-YPXjoqPz6X68rJFkQEmsEVGHx22vNmrXq0O__SP5AkeSOoU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods and apparatus for providing a semiconductor optical flexured mass accelerometer</title><source>esp@cenet</source><creator>TAWNEY JESSE ; HAKIMI FARHAD</creator><creatorcontrib>TAWNEY JESSE ; HAKIMI FARHAD</creatorcontrib><description>Methods and apparatus are provided for integrating various optical components onto a planar substrate using a single semiconductor material system to produce an accelerometer. A light beam is generated on the semiconductor optical accelerometer. The light beam is split to form two light beams using a multimode interference (MMI) coupler. One of the two light beams that is formed is directed towards a reference mirror and the other is directed towards a flexured mirror. The flexured mirror moves as a result of acceleration and thereby reflects the light beam with a different light beam characteristic. The light beams are combined by the MMI coupler to produce an interference light beam. A microprocessor measures acceleration based on the differences in light beam characteristics of the reflected light beams. Along the optical path light beam detectors measure various beam characteristics. The microprocessor accounts for characteristics measured by the detectors when computing acceleration.</description><language>eng</language><subject>GYROSCOPIC INSTRUMENTS ; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT ; MEASURING ; MEASURING DISTANCES, LEVELS OR BEARINGS ; MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK ; NAVIGATION ; PHOTOGRAMMETRY OR VIDEOGRAMMETRY ; PHYSICS ; SURVEYING ; TESTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20101005&amp;DB=EPODOC&amp;CC=US&amp;NR=7808618B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20101005&amp;DB=EPODOC&amp;CC=US&amp;NR=7808618B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAWNEY JESSE</creatorcontrib><creatorcontrib>HAKIMI FARHAD</creatorcontrib><title>Methods and apparatus for providing a semiconductor optical flexured mass accelerometer</title><description>Methods and apparatus are provided for integrating various optical components onto a planar substrate using a single semiconductor material system to produce an accelerometer. A light beam is generated on the semiconductor optical accelerometer. The light beam is split to form two light beams using a multimode interference (MMI) coupler. One of the two light beams that is formed is directed towards a reference mirror and the other is directed towards a flexured mirror. The flexured mirror moves as a result of acceleration and thereby reflects the light beam with a different light beam characteristic. The light beams are combined by the MMI coupler to produce an interference light beam. A microprocessor measures acceleration based on the differences in light beam characteristics of the reflected light beams. Along the optical path light beam detectors measure various beam characteristics. The microprocessor accounts for characteristics measured by the detectors when computing acceleration.</description><subject>GYROSCOPIC INSTRUMENTS</subject><subject>INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT</subject><subject>MEASURING</subject><subject>MEASURING DISTANCES, LEVELS OR BEARINGS</subject><subject>MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK</subject><subject>NAVIGATION</subject><subject>PHOTOGRAMMETRY OR VIDEOGRAMMETRY</subject><subject>PHYSICS</subject><subject>SURVEYING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjD0KAjEUBrexEPUO7wKCi6CpFcXGSsVyeSRf3ECSF_IjHt8tPIDVFDPMvHteUUcxhTga4pQ4c22FrGRKWd7OuPgipoLgtETTdJ2MpOo0e7Ien5ZhKHCZDlrDI0tARV52M8u-YPXjoqPz6X68rJFkQEmsEVGHx22vNmrXq0O__SP5AkeSOoU</recordid><startdate>20101005</startdate><enddate>20101005</enddate><creator>TAWNEY JESSE</creator><creator>HAKIMI FARHAD</creator><scope>EVB</scope></search><sort><creationdate>20101005</creationdate><title>Methods and apparatus for providing a semiconductor optical flexured mass accelerometer</title><author>TAWNEY JESSE ; HAKIMI FARHAD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7808618B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><topic>GYROSCOPIC INSTRUMENTS</topic><topic>INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT</topic><topic>MEASURING</topic><topic>MEASURING DISTANCES, LEVELS OR BEARINGS</topic><topic>MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK</topic><topic>NAVIGATION</topic><topic>PHOTOGRAMMETRY OR VIDEOGRAMMETRY</topic><topic>PHYSICS</topic><topic>SURVEYING</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TAWNEY JESSE</creatorcontrib><creatorcontrib>HAKIMI FARHAD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAWNEY JESSE</au><au>HAKIMI FARHAD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods and apparatus for providing a semiconductor optical flexured mass accelerometer</title><date>2010-10-05</date><risdate>2010</risdate><abstract>Methods and apparatus are provided for integrating various optical components onto a planar substrate using a single semiconductor material system to produce an accelerometer. A light beam is generated on the semiconductor optical accelerometer. The light beam is split to form two light beams using a multimode interference (MMI) coupler. One of the two light beams that is formed is directed towards a reference mirror and the other is directed towards a flexured mirror. The flexured mirror moves as a result of acceleration and thereby reflects the light beam with a different light beam characteristic. The light beams are combined by the MMI coupler to produce an interference light beam. A microprocessor measures acceleration based on the differences in light beam characteristics of the reflected light beams. Along the optical path light beam detectors measure various beam characteristics. The microprocessor accounts for characteristics measured by the detectors when computing acceleration.</abstract><oa>free_for_read</oa></addata></record>
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subjects GYROSCOPIC INSTRUMENTS
INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
MEASURING
MEASURING DISTANCES, LEVELS OR BEARINGS
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK
NAVIGATION
PHOTOGRAMMETRY OR VIDEOGRAMMETRY
PHYSICS
SURVEYING
TESTING
title Methods and apparatus for providing a semiconductor optical flexured mass accelerometer
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T13%3A18%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TAWNEY%20JESSE&rft.date=2010-10-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7808618B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true