Method and apparatus for memory AC timing measurement

A timing measurement circuit inside a memory chip delays balanced test signals for generating delayed test signals. Each of the delayed test signals is input a corresponding input pin of a memory subsystem of the memory chip. By adjusting delay amount of the delayed test signals, AC timing parameter...

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Bibliographische Detailangaben

Hauptverfasser:	HSIEH SHANGIH, HSU CHIHIANG
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING HOROLOGY INFORMATION STORAGE PHYSICS STATIC STORES TIME-INTERVAL MEASURING
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