High-conductivity contacting-type conductivity measurement

An improved contacting-type conductivity measurement system and method are provided. A first conductivity measurement is obtained by driving a contacting-type conductivity sensor with an excitation voltage at a first frequency, a second conductivity is obtained by driving the contacting-type conduct...

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description An improved contacting-type conductivity measurement system and method are provided. A first conductivity measurement is obtained by driving a contacting-type conductivity sensor with an excitation voltage at a first frequency, a second conductivity is obtained by driving the contacting-type conductivity sensor with the excitation voltage at a second frequency. The first and second conductivity measurements are used to provide a more accurate conductivity output.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7772854B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7772854B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7772854B23</originalsourceid><addsrcrecordid>eNrjZLDyyEzP0E3Oz0spTS7JLMssqVQAckoSgZy8dN2SyoJUBRTJ3NTE4tKi1NzUvBIeBta0xJziVF4ozc2g4OYa4uyhm1qQH59aXJCYnJqXWhIfGmxubm5kYWriZGRMhBIApJYwGQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>High-conductivity contacting-type conductivity measurement</title><source>esp@cenet</source><creator>REZVANI BEHZAD</creator><creatorcontrib>REZVANI BEHZAD</creatorcontrib><description>An improved contacting-type conductivity measurement system and method are provided. A first conductivity measurement is obtained by driving a contacting-type conductivity sensor with an excitation voltage at a first frequency, a second conductivity is obtained by driving the contacting-type conductivity sensor with the excitation voltage at a second frequency. The first and second conductivity measurements are used to provide a more accurate conductivity output.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20100810&amp;DB=EPODOC&amp;CC=US&amp;NR=7772854B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20100810&amp;DB=EPODOC&amp;CC=US&amp;NR=7772854B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>REZVANI BEHZAD</creatorcontrib><title>High-conductivity contacting-type conductivity measurement</title><description>An improved contacting-type conductivity measurement system and method are provided. A first conductivity measurement is obtained by driving a contacting-type conductivity sensor with an excitation voltage at a first frequency, a second conductivity is obtained by driving the contacting-type conductivity sensor with the excitation voltage at a second frequency. The first and second conductivity measurements are used to provide a more accurate conductivity output.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDyyEzP0E3Oz0spTS7JLMssqVQAckoSgZy8dN2SyoJUBRTJ3NTE4tKi1NzUvBIeBta0xJziVF4ozc2g4OYa4uyhm1qQH59aXJCYnJqXWhIfGmxubm5kYWriZGRMhBIApJYwGQ</recordid><startdate>20100810</startdate><enddate>20100810</enddate><creator>REZVANI BEHZAD</creator><scope>EVB</scope></search><sort><creationdate>20100810</creationdate><title>High-conductivity contacting-type conductivity measurement</title><author>REZVANI BEHZAD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7772854B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>REZVANI BEHZAD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>REZVANI BEHZAD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>High-conductivity contacting-type conductivity measurement</title><date>2010-08-10</date><risdate>2010</risdate><abstract>An improved contacting-type conductivity measurement system and method are provided. A first conductivity measurement is obtained by driving a contacting-type conductivity sensor with an excitation voltage at a first frequency, a second conductivity is obtained by driving the contacting-type conductivity sensor with the excitation voltage at a second frequency. The first and second conductivity measurements are used to provide a more accurate conductivity output.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title High-conductivity contacting-type conductivity measurement
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T09%3A04%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=REZVANI%20BEHZAD&rft.date=2010-08-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7772854B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true