Using neighborhood functions to extract logical models of physical failures using layout based diagnosis

A method and apparatus are disclosed in which defect behavior in an integrated circuit is discovered and modeled rather than assuming defect behavior in the form of a fault. A plurality of tests are performed on an integrated circuit to produce passing and failing responses. The failing responses ar...

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Bibliographische Detailangaben

Hauptverfasser:	DESINENI RAO H, BLANTON RONALD DESHAWN, MALY WOJCIECH
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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