Testing differential signal standards using device under test's built in resistors

A test setup is provided to test differential signals outputs from the I/O block (IOB) pairs in an integrated circuit (IC). The test setup allows elimination of the external 100 Ohm resistors provided across the differential outputs on a device under test (DUT) test board containing the IC by taking...

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Bibliographische Detailangaben

Hauptverfasser:	SADLER BRIAN, SIMMONS TUYET NGOC, SIMMONS MICHAEL LEONARD, LAI ANDREW W
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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