Input of test conditions and output generation for built-in self test

A system and method is discussed for providing programmable test conditions for a built-in self test circuit of a flash memory device. The present invention employs a flash memory having BIST circuit for testing the memory and a BIST interface circuit adapted to adjust the test conditions of the mem...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LEE MIMI, HAMILTON DARLENE, CHEAH KEN CHEONG
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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