Plural light source and camera to detect surface flaws

Plural light source and camera to detect surface flaws

A method for detecting specular surface flaws on a coated substrate includes impinging visible non-integrated electromagnetic radiation from a first source onto the coated substrate, reflecting the visible non-integrated electromagnetic radiation off the coated substrate into a first photosensitive...

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Hauptverfasser: ZAMAN KAMRAN UZ, PIETRANTONI DANTE, SCHICHLER RICHARD, PIETRZYKOWSKI STANLEY, GOTTSCHALK KENNETH
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator ZAMAN KAMRAN UZ
PIETRANTONI DANTE
SCHICHLER RICHARD
PIETRZYKOWSKI STANLEY
GOTTSCHALK KENNETH
description A method for detecting specular surface flaws on a coated substrate includes impinging visible non-integrated electromagnetic radiation from a first source onto the coated substrate, reflecting the visible non-integrated electromagnetic radiation off the coated substrate into a first photosensitive device, forming a recorded high frequency surface flaw image, and impinging visible coherent electromagnetic radiation from a second source onto a coated substrate at an oblique angle. The visible non-integrated electromagnetic radiation and the visible coherent electromagnetic radiation on the coated substrate are collocated but not combined on the substrate. The visible coherent electromagnetic radiation is reflected off the coated substrate onto a screen material to form a low frequency surface flaw image. The low frequency surface flaw image is recorded to form a recorded low frequency surface flaw image.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Plural light source and camera to detect surface flaws
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