Lithographic apparatus and device manufacturing method

A method and apparatus make use of data representing changes in wavelength of a radiation source to provide control of focal plane position or to provide correction of sensor data. In the first aspect, the wavelength variation data is provided to control systems that control focus by moving apparatu...

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Bibliographische Detailangaben
Hauptverfasser: MOEST BEARRACH, CASTENMILLER THOMAS JOSEPHUS MARIA, HAAST MARC ANTONIUS MARIA, BUURMAN ERIK PETRUS, TEEUWSEN JOHANNES WILHELMUS MARIA CORNELIS
Format: Patent
Sprache:eng
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