System and method for producing color contour maps of surface defects of high pressure pipelines

A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes t...

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Bibliographische Detailangaben

Hauptverfasser:	GOYEN TODD, CROUCH ALFRED E, LAUGHLIN SHAWN, PORTER PATRICK C
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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