Method of forming semiconductor devices by microwave curing of low-k dielectric films

The invention provides a method of exposing low-k dielectric films to microwave radiation to cure the dielectric films. Microwave curing reduces the cure-time necessary to achieve the desired mechanical properties in the low-k films, thus decreasing the thermal exposure time for the NiSi transistor...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: RYAN E. TODD, IACOPONI JOHN A
Format: Patent
Sprache:eng
Schlagworte:
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