Digital temperature detection circuit adapted for use with semiconductor device
A digital temperature detection circuit adapted for use with a semiconductor device is disclosed. The digital temperature detection circuit comprises a digital temperature generation unit adapted to detect an internal temperature of the semiconductor device, convert the internal temperature into per...
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| creator | CHUN BYUNG KWAN NAM JEONG SIK |
| description | A digital temperature detection circuit adapted for use with a semiconductor device is disclosed. The digital temperature detection circuit comprises a digital temperature generation unit adapted to detect an internal temperature of the semiconductor device, convert the internal temperature into perception data in accordance with a perception data code, and output the perception data. The digital temperature detection circuit further comprises an offset shift unit adapted to shift the perception data in accordance with offset data to thereby generate standard data; and, an offset generation unit adapted to generate the offset data, wherein the offset generation unit is controlled from outside of the digital temperature detection circuit. |
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The digital temperature detection circuit comprises a digital temperature generation unit adapted to detect an internal temperature of the semiconductor device, convert the internal temperature into perception data in accordance with a perception data code, and output the perception data. The digital temperature detection circuit further comprises an offset shift unit adapted to shift the perception data in accordance with offset data to thereby generate standard data; and, an offset generation unit adapted to generate the offset data, wherein the offset generation unit is controlled from outside of the digital temperature detection circuit.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC INCANDESCENT LAMPS ; ELECTRICITY ; MEASURING ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20090623&DB=EPODOC&CC=US&NR=7549796B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20090623&DB=EPODOC&CC=US&NR=7549796B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHUN BYUNG KWAN</creatorcontrib><creatorcontrib>NAM JEONG SIK</creatorcontrib><title>Digital temperature detection circuit adapted for use with semiconductor device</title><description>A digital temperature detection circuit adapted for use with a semiconductor device is disclosed. The digital temperature detection circuit comprises a digital temperature generation unit adapted to detect an internal temperature of the semiconductor device, convert the internal temperature into perception data in accordance with a perception data code, and output the perception data. The digital temperature detection circuit further comprises an offset shift unit adapted to shift the perception data in accordance with offset data to thereby generate standard data; and, an offset generation unit adapted to generate the offset data, wherein the offset generation unit is controlled from outside of the digital temperature detection circuit.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC INCANDESCENT LAMPS</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjsOwjAQRVE3FAjYw2yAhl-Ulp_oKIA6Go1fwkhJbNlj2D4ULIDqSkd36q5H7dS4J8MQkdhKAnkYxDSMJJqkqBF7jgZPbUhUMuit9qSMQSWMvoh92eOlgrmbtNxnLH6dOTqf7ofLEjE0yJEFI6x53Krtpq7q3X61_mP5AELEN3Y</recordid><startdate>20090623</startdate><enddate>20090623</enddate><creator>CHUN BYUNG KWAN</creator><creator>NAM JEONG SIK</creator><scope>EVB</scope></search><sort><creationdate>20090623</creationdate><title>Digital temperature detection circuit adapted for use with semiconductor device</title><author>CHUN BYUNG KWAN ; NAM JEONG SIK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7549796B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC INCANDESCENT LAMPS</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>CHUN BYUNG KWAN</creatorcontrib><creatorcontrib>NAM JEONG SIK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHUN BYUNG KWAN</au><au>NAM JEONG SIK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Digital temperature detection circuit adapted for use with semiconductor device</title><date>2009-06-23</date><risdate>2009</risdate><abstract>A digital temperature detection circuit adapted for use with a semiconductor device is disclosed. The digital temperature detection circuit comprises a digital temperature generation unit adapted to detect an internal temperature of the semiconductor device, convert the internal temperature into perception data in accordance with a perception data code, and output the perception data. The digital temperature detection circuit further comprises an offset shift unit adapted to shift the perception data in accordance with offset data to thereby generate standard data; and, an offset generation unit adapted to generate the offset data, wherein the offset generation unit is controlled from outside of the digital temperature detection circuit.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC INCANDESCENT LAMPS ELECTRICITY MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
| title | Digital temperature detection circuit adapted for use with semiconductor device |
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