Sense amplifier with leakage testing and read debug capability

Sense amplifier with leakage testing and read debug capability

Disclosed is a high speed and power efficient dual mode sense amplifier circuit, which comprises a configuration selector further comprising a read amplifier, a debug circuit and a backup read circuit. The dual mode sense amplifier circuit also comprises a controllable input node further comprising...

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Hauptverfasser: HIROSE RYAN TASUO, SRINIVASA RAGHAVAN VIJAY KUMAR
Format: Patent
Sprache:eng
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INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator HIROSE RYAN TASUO
SRINIVASA RAGHAVAN VIJAY KUMAR
description Disclosed is a high speed and power efficient dual mode sense amplifier circuit, which comprises a configuration selector further comprising a read amplifier, a debug circuit and a backup read circuit. The dual mode sense amplifier circuit also comprises a controllable input node further comprising an enabling circuit, the controllable input node being coupled to the configuration selector and the dual mode sense amplifier circuit comprises a differential signal generator further comprising a reference signal source, the differential signal generator is coupled to the controllable input node. A method of dual mode sensing and other embodiments are also disclosed.
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subjects INFORMATION STORAGE
PHYSICS
STATIC STORES
title Sense amplifier with leakage testing and read debug capability
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